Wasserstein Distribution Correction for Improved Robustness in Deep Neural Networks

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Fields of Expertise

ARCHIMEDES - Automatic and Reliable Classification of Highly Inline Measured Wafer Edge Defects using Embedded Screeners
Pernkopf, F. (Project manager on research unit), Römer, K. U. (Project manager on research unit) & Brenner, E. (Project manager on research unit)
1/08/17 → 30/09/19
Project: Research project
Intelligent Systems
Pernkopf, F. (Contact person)
1/01/02 → 31/12/24
Project: Research area