Visual Feature Space Analysis for Unsupervised Effectiveness Estimation and Feature Engineering

Tobias Schreck, Daniel A. Keim, Christian Panse

    Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

    Original languageEnglish
    Title of host publicationConference proceedings / ICME 2006
    Place of PublicationPiscataway, NJ
    PublisherIEEE
    Pages925-928
    ISBN (Print)1-42440-367-7
    DOIs
    Publication statusPublished - 2006
    Event2006 IEEE International Conference on Multimedia and Expo: ICME 2006 - Toronto, Canada
    Duration: 9 Jul 200612 Jul 2006

    Conference

    Conference2006 IEEE International Conference on Multimedia and Expo
    Country/TerritoryCanada
    CityToronto
    Period9/07/0612/07/06

    Fields of Expertise

    • Sonstiges

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