Using Spherical Indexing for the investigation of Recrystallization in Wrought Aluminum Alloys

In electron backscatter diffraction (EBSD), the patterns are usually indexed by Hough indexing. In many cases where the patterns are of good quality, this works very well and the maps ob-tained have a high indexing rate. For poor quality patterns, Hough indexing fails. To overcome the limitations of Hough indexing, pattern matching methods have been developed in recent years, leading to the introduction of spherical indexing [1]. In spherical indexing, a simulated master pattern is used onto which the experimental pattern is projected back, and the orienta-tion is determined via cross-correlation. This technique enables much better indexing of poor patterns and more accurate determination of the orientation, i.e., the noise level in the orien-tation is lower.