Total Ionizing Dose Effects on Delay Variability of Integrated Circuits with Metastable Transitions - Selected Delay Stages Embedded into 40~nm bulk CMOS Ring Oscillators

Research output: Contribution to conferencePosterpeer-review

Original languageEnglish
Publication statusPublished - 17 Sept 2024
EventRadiation and its Effects on Components and Systems - ExpoMeloneras Conference Centre, Maspalomas, Spain
Duration: 16 Sept 202420 Sept 2024
Conference number: 24th
https://radecs2024.org/

Conference

ConferenceRadiation and its Effects on Components and Systems
Abbreviated titleRADECS
Country/TerritorySpain
CityMaspalomas
Period16/09/2420/09/24
Internet address

Keywords

  • reliability
  • variability
  • CMOS
  • integrated circuit
  • Total Ionizing Dose
  • TID

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Fields of Expertise

  • Advanced Materials Science

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