Total Ionizing Dose Effects on Delay Variability of Integrated Circuits with Metastable Transitions - Selected Delay Stages Embedded into 40~nm bulk CMOS Ring Oscillators
- Semih Ramazanoglu*
- , Alicja Malgorzata Michalowska-Forsyth
*Corresponding author for this work
Research output: Contribution to conference › Paper › peer-review