The Influence of Ionizing Radiation on the Electromagnetic Immunity of a Bandgap Reference

Nikolaus Juch; Alicja Michalowska-Forsyth; Daniel Kircher; Bernd Deutschmann

doi:10.1109/EMCEurope61644.2025.11176241

The Influence of Ionizing Radiation on the Electromagnetic Immunity of a Bandgap Reference

Nikolaus Juch
, Alicja Michalowska-Forsyth
, Daniel Kircher
, Bernd Deutschmann

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

During operation, electronic systems are often exposed to a wide range of external disturbances, potentially including electromagnetic interference (EMI) and ionizing radiation. Evaluating the electromagnetic immunity of integrated circuits (ICs) is well established but usually performed under nominal operating conditions only. It is important to assess combined effects during system evaluation to reflect a circuit’s performance under realistic environmental conditions. This study investigates the combined effects of electromagnetic interference and ionizing radiation on a custom voltage reference circuit fabricated in a commercial 180 nm CMOS process. Direct power injection measurements were conducted on an untreated sample and after exposing it to ionizing radiation with low-energy X-rays up to a total dose of 25 Mrad. The offset induced by electromagnetic interference was measured over a frequency range of 1 MHz to 1 GHz. A detailed analysis of the dose-related changes in immunity to electromagnetic interference is presented in the form of measured results and initial simulation examples.

Original language	English
Title of host publication	2025 International Symposium on Electromagnetic Compatibility – EMC Europe
Publisher	IEEE Xplore
Pages	763-767
Number of pages	5
ISBN (Electronic)	9798331596446
ISBN (Print)	979-8-3315-9646-0
DOIs	https://doi.org/10.1109/EMCEurope61644.2025.11176241
Publication status	Published - 29 Sept 2025
Event	2025 International Symposium on Electromagnetic Compatibility – EMC Europe - Sorbonne University, Paris, France Duration: 1 Sept 2025 → 5 Sept 2025 https://premc.org/emceurope2025/

Conference

Conference	2025 International Symposium on Electromagnetic Compatibility – EMC Europe
Country/Territory	France
City	Paris
Period	1/09/25 → 5/09/25
Internet address	https://premc.org/emceurope2025/

Keywords

Ionizing radiation
Power measurement
Photonic band gap
Electromagnetic interference
X-rays
Immunity testing
Frequency measurement
Total ionizing dose
Electromagnetics
Monitoring
total ionizing dose (TID)
combined effects
irradiation
direct power injection (DPI)
electromagnetic immunity
bandgap reference

ASJC Scopus subject areas

Radiation
Instrumentation
Energy Engineering and Power Technology
Electrical and Electronic Engineering

Fields of Expertise

Sonstiges

Access to Document

10.1109/EMCEurope61644.2025.11176241

Cite this

The Influence of Ionizing Radiation on the Electromagnetic Immunity of a Bandgap Reference. / Juch, Nikolaus; Michalowska-Forsyth, Alicja; Kircher, Daniel et al.
2025 International Symposium on Electromagnetic Compatibility – EMC Europe. IEEE Xplore, 2025. p. 763-767 11176241.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Juch, N, Michalowska-Forsyth, A, Kircher, D & Deutschmann, B 2025, The Influence of Ionizing Radiation on the Electromagnetic Immunity of a Bandgap Reference. in 2025 International Symposium on Electromagnetic Compatibility – EMC Europe., 11176241, IEEE Xplore, pp. 763-767, 2025 International Symposium on Electromagnetic Compatibility – EMC Europe, Paris, France, 1/09/25. https://doi.org/10.1109/EMCEurope61644.2025.11176241

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AB - During operation, electronic systems are often exposed to a wide range of external disturbances, potentially including electromagnetic interference (EMI) and ionizing radiation. Evaluating the electromagnetic immunity of integrated circuits (ICs) is well established but usually performed under nominal operating conditions only. It is important to assess combined effects during system evaluation to reflect a circuit’s performance under realistic environmental conditions. This study investigates the combined effects of electromagnetic interference and ionizing radiation on a custom voltage reference circuit fabricated in a commercial 180 nm CMOS process. Direct power injection measurements were conducted on an untreated sample and after exposing it to ionizing radiation with low-energy X-rays up to a total dose of 25 Mrad. The offset induced by electromagnetic interference was measured over a frequency range of 1 MHz to 1 GHz. A detailed analysis of the dose-related changes in immunity to electromagnetic interference is presented in the form of measured results and initial simulation examples.

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KW - Electromagnetic interference

KW - X-rays

KW - Immunity testing

KW - Frequency measurement

KW - Total ionizing dose

KW - Electromagnetics

KW - Monitoring

KW - total ionizing dose (TID)

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KW - irradiation

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ER -

The Influence of Ionizing Radiation on the Electromagnetic Immunity of a Bandgap Reference

Abstract

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ASJC Scopus subject areas

Fields of Expertise

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