Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits

Maximilian Hofer, Christoph Böhm, Wolfgang Pribyl

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	German
Title of host publication	ISIC2011
Publisher	IEEE
Publication status	Accepted/In press - 2011
Event	International Symposium on Integrated Circuits, ISIC - Singapur, Singapore Duration: 12 Dec 2011 → 15 Dec 2011

Conference	International Symposium on Integrated Circuits, ISIC
Country/Territory	Singapore
City	Singapur
Period	12/12/11 → 15/12/11

Fields of Expertise

@inproceedings{ea70b7006dcb4a3b93a5bbfb2135a0ff,

title = "Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits",

author = "Maximilian Hofer and Christoph B{\"o}hm and Wolfgang Pribyl",

year = "2011",

language = "deutsch",

booktitle = "ISIC2011",

publisher = "IEEE",

address = "USA / Vereinigte Staaten",

note = "International Symposium on Integrated Circuits, ISIC ; Conference date: 12-12-2011 Through 15-12-2011",

}

TY - GEN

T1 - Temperature Behavior Mismatch of Halo Implanted Short Channel Transistors and its Influence on PUF Circuits

AU - Hofer, Maximilian

AU - Böhm, Christoph

AU - Pribyl, Wolfgang

PY - 2011

Y1 - 2011

M3 - Beitrag in einem Konferenzband

BT - ISIC2011

PB - IEEE

T2 - International Symposium on Integrated Circuits, ISIC

Y2 - 12 December 2011 through 15 December 2011

ER -