Soft-Failures in Component-Level ESD Testing on the Example of Flip-Flop Data Retention

Patrick Schrey

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

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Soft-Failures in Component-Level ESD Testing on the Example of Flip-Flop Data Retention
Schrey, P. (Speaker)
22 Oct 2019
Activity: Talk or presentation › Talk at conference or symposium › Science to science