Recurrent Dilated DenseNets for a Time-Series Segmentation Task

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	IEEE International Conference on Machine Learning and Applications
Publication status	Published - 2019

ARCHIMEDES - Automatic and Reliable Classification of Highly Inline Measured Wafer Edge Defects using Embedded Screeners
Pernkopf, F. (Project manager on research unit), Römer, K. U. (Project manager on research unit) & Brenner, E. (Project manager on research unit)
1/08/17 → 30/09/19
Project: Research project

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