Program time effects on Total ionizing Dose tolerance of Sidewall Spacer Memory Bit Cell

Research output: Contribution to conference › Paper › peer-review

Original language	English
DOIs	https://doi.org/10.1109/Austrochip.2019.00021
Publication status	Published - 24 Oct 2019
Event	27th Austrochip Workshop on Microelectronics: Austrochip 2019 - FH Technikum Wien, Wien, Austria Duration: 24 Oct 2019 → 24 Oct 2019 Conference number: 27 https://embsys.technikum-wien.at/austrochip2019/ https://embsys.technikum-wien.at/austrochip2019/program/index.htm

Workshop	27th Austrochip Workshop on Microelectronics
Abbreviated title	Austrochip
Country/Territory	Austria
City	Wien
Period	24/10/19 → 24/10/19
Internet address	https://embsys.technikum-wien.at/austrochip2019/ https://embsys.technikum-wien.at/austrochip2019/program/index.htm

Keywords

Program time effects on Total ionizing Dose tolerance of Sidewall Spacer Memory Bit Cell
Vincenzi, T., Schatzberger, G. & Michalowska-Forsyth, A. M., 24 Oct 2019, 2019 Austrochip Workshop on Microelectronics: Austrochip 2019. Vienna, p. 55 58 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

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title = "Program time effects on Total ionizing Dose tolerance of Sidewall Spacer Memory Bit Cell",

keywords = "Nonvolatile Memories, Integrated Circuits, Total Ionizing Dose, Radiation Hardness",

author = "Tommaso Vincenzi and Gregor Schatzberger and Michalowska-Forsyth, \{Alicja Malgorzata\}",

year = "2019",

month = oct,

day = "24",

doi = "10.1109/Austrochip.2019.00021",

language = "English",

note = "27th Austrochip Workshop on Microelectronics : Austrochip 2019, Austrochip ; Conference date: 24-10-2019 Through 24-10-2019",

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}

TY - CONF

T1 - Program time effects on Total ionizing Dose tolerance of Sidewall Spacer Memory Bit Cell

AU - Vincenzi, Tommaso

AU - Schatzberger, Gregor

AU - Michalowska-Forsyth, Alicja Malgorzata

N1 - Conference code: 27

PY - 2019/10/24

Y1 - 2019/10/24

KW - Nonvolatile Memories

KW - Integrated Circuits

KW - Total Ionizing Dose

KW - Radiation Hardness

U2 - 10.1109/Austrochip.2019.00021

DO - 10.1109/Austrochip.2019.00021

M3 - Paper

T2 - 27th Austrochip Workshop on Microelectronics

Y2 - 24 October 2019 through 24 October 2019

ER -