Program time effects on Total ionizing Dose tolerance of Sidewall Spacer Memory Bit Cell

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	2019 Austrochip Workshop on Microelectronics
Subtitle of host publication	Austrochip 2019
Place of Publication	Vienna
Pages	55
Number of pages	58
ISBN (Electronic)	978-1-7281-1953-3
Publication status	Published - 24 Oct 2019
Event	27th Austrochip Workshop on Microelectronics: Austrochip 2019 - FH Technikum Wien, Wien, Austria Duration: 24 Oct 2019 → 24 Oct 2019 Conference number: 27 https://embsys.technikum-wien.at/austrochip2019/ https://embsys.technikum-wien.at/austrochip2019/program/index.htm

Workshop	27th Austrochip Workshop on Microelectronics
Abbreviated title	Austrochip
Country/Territory	Austria
City	Wien
Period	24/10/19 → 24/10/19
Internet address	https://embsys.technikum-wien.at/austrochip2019/ https://embsys.technikum-wien.at/austrochip2019/program/index.htm

Keywords

Program time effects on Total ionizing Dose tolerance of Sidewall Spacer Memory Bit Cell
Vincenzi, T., Schatzberger, G. & Michalowska-Forsyth, A. M., 24 Oct 2019.
Research output: Contribution to conference › Paper › peer-review

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title = "Program time effects on Total ionizing Dose tolerance of Sidewall Spacer Memory Bit Cell",

keywords = "Nonvolatile Memories, Radiation Hardness, Total Ionizing Dose",

author = "Tommaso Vincenzi and Gregor Schatzberger and Michalowska-Forsyth, \{Alicja Malgorzata\}",

year = "2019",

month = oct,

day = "24",

language = "English",

pages = "55",

booktitle = "2019 Austrochip Workshop on Microelectronics",

note = "27th Austrochip Workshop on Microelectronics : Austrochip 2019, Austrochip ; Conference date: 24-10-2019 Through 24-10-2019",

url = "https://embsys.technikum-wien.at/austrochip2019/, https://embsys.technikum-wien.at/austrochip2019/program/index.htm",

}

TY - GEN

T1 - Program time effects on Total ionizing Dose tolerance of Sidewall Spacer Memory Bit Cell

AU - Vincenzi, Tommaso

AU - Schatzberger, Gregor

AU - Michalowska-Forsyth, Alicja Malgorzata

N1 - Conference code: 27

PY - 2019/10/24

Y1 - 2019/10/24

KW - Nonvolatile Memories

KW - Radiation Hardness

KW - Total Ionizing Dose

M3 - Conference paper

SP - 55

BT - 2019 Austrochip Workshop on Microelectronics

CY - Vienna

T2 - 27th Austrochip Workshop on Microelectronics

Y2 - 24 October 2019 through 24 October 2019

ER -