@inproceedings{30a3d5322f8e4ad4b10e11c06689e28d,
title = "Prediction of the robustness of integrated circuits against EFT/BURST",
author = "Bauer, \{Susanne Maria\} and Bernd Deutschmann and Gunter Winkler",
year = "2015",
doi = "10.1109/ISEMC.2015.7256130",
language = "English",
isbn = "978-1-4799-6615-8",
pages = "45--49",
booktitle = "2015 IEEE International Symposium on Electromagnetic Compatibility (EMC)",
publisher = "IEEE",
address = "United States",
note = "IEEE International Symposium on Electromagnetic Compatibility : EMC 2015 ; Conference date: 16-08-2015 Through 22-08-2015",
}