Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure

Alfred Neuhold; Stefanie Fladischer; Stefan Mitsche; Nadezda Matsko; Heinz-Georg Flesch; Armin Moser; Jiri Novak; E. Kraker; A. Haase; Werner Grogger; Roland Resel

Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure

Alfred Neuhold
, Stefanie Fladischer
, Stefan Mitsche
, Nadezda Matsko
, Heinz-Georg Flesch
, Armin Moser
, Jiri Novak
, E. Kraker
, A. Haase
, Werner Grogger
, Roland Resel

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	International Conference on Organic Electronics
Publisher	.
Pages	237-237
Publication status	Published - 2010
Event	International Conference of Organic Electronics 2010 - Paris, Frankreich Duration: 22 Jun 2010 → 25 Jun 2010

Conference

Conference	International Conference of Organic Electronics 2010
City	Paris, Frankreich
Period	22/06/10 → 25/06/10

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

FWF - ISOTEC_DevAna - Nanoanalysis and Nanostructuring of organic optoelectronic Devices
Matsko, N. (Attendee / Assistant), Fisslthaler, E. (Attendee / Assistant), Grogger, W. (Project manager) & Sezen, M. (Attendee / Assistant)
1/02/05 → 31/08/11
Project: Research project

Cite this

Neuhold, A, Fladischer, S, Mitsche, S, Matsko, N, Flesch, H-G, Moser, A, Novak, J, Kraker, E, Haase, A, Grogger, W & Resel, R 2010, Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure. in International Conference on Organic Electronics. ., pp. 237-237, International Conference of Organic Electronics 2010, Paris, Frankreich, 22/06/10.

@inproceedings{3640d7d9a14c420dac07a77334056d69,

title = "Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure",

author = "Alfred Neuhold and Stefanie Fladischer and Stefan Mitsche and Nadezda Matsko and Heinz-Georg Flesch and Armin Moser and Jiri Novak and E. Kraker and A. Haase and Werner Grogger and Roland Resel",

year = "2010",

language = "English",

pages = "237--237",

booktitle = "International Conference on Organic Electronics",

publisher = ".",

note = "International Conference of Organic Electronics 2010 ; Conference date: 22-06-2010 Through 25-06-2010",

}

TY - GEN

T1 - Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure

AU - Neuhold, Alfred

AU - Fladischer, Stefanie

AU - Mitsche, Stefan

AU - Matsko, Nadezda

AU - Flesch, Heinz-Georg

AU - Moser, Armin

AU - Novak, Jiri

AU - Kraker, E.

AU - Haase, A.

AU - Grogger, Werner

AU - Resel, Roland

PY - 2010

Y1 - 2010

M3 - Conference paper

SP - 237

EP - 237

BT - International Conference on Organic Electronics

PB - .

T2 - International Conference of Organic Electronics 2010

Y2 - 22 June 2010 through 25 June 2010

ER -

Organic Multylayer Photodiode: Interface Roughness and Electron Density Profile in a Stacked Device Structure

Conference

Fields of Expertise

Treatment code (Nähere Zuordnung)

Projects

FWF - ISOTEC_DevAna - Nanoanalysis and Nanostructuring of organic optoelectronic Devices

Cite this