Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise

Semih Ramazanoglu; Alicja Michalowska-Forsyth; Bernd Deutschmann

doi:10.1109/Austrochip61217.2023.10285162

Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise

Semih Ramazanoglu^*
, Alicja Michalowska-Forsyth
, Bernd Deutschmann

^*Corresponding author for this work

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

The Random Telegraph Noise (RTN) is one of the major reliability concerns in nanoscale CMOS technologies. In this paper, we discuss the characterization of RTN in 40 nm CMOS technology using Ring Oscillators (ROSCs). We used two different types of ROSCs to study the temporal and spectral characteristics of the RTN. With this work, we analyse the suitability of the two types of ROSC for on chip statistical analysis of the RTN amplitude strength and its frequency characteristics. Already the preliminary results, without complete statistical coverage show f/f_max variations of up to 7.18% which maximize RTN observability. Further, the observed broad variations in normalized phase noise under varying power supply levels in the range of 0.5 V to 1 V indicate that also the bias dependence of RTN centers can be investigated using the ROSC technique.

Original language	English
Title of host publication	2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings
Publisher	IEEE
Pages	27-30
Number of pages	4
ISBN (Electronic)	9798350357851
DOIs	https://doi.org/10.1109/Austrochip61217.2023.10285162
Publication status	Published - 2023
Event	2023 Austrochip Workshop on Microelectronics: Austrochip 2023 - Graz, Austria Duration: 20 Sept 2023 → 21 Sept 2023

Workshop

Workshop	2023 Austrochip Workshop on Microelectronics
Abbreviated title	Austrochip 2023
Country/Territory	Austria
City	Graz
Period	20/09/23 → 21/09/23

Keywords

Jitter
Oxide-trap
Random Telegraph Noise
Ring Oscillator
RTN

ASJC Scopus subject areas

Electrical and Electronic Engineering
Safety, Risk, Reliability and Quality
Hardware and Architecture
Instrumentation

Access to Document

10.1109/Austrochip61217.2023.10285162

Cite this

Ramazanoglu, S , Michalowska-Forsyth, A & Deutschmann, B 2023, Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise. in 2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings. IEEE, pp. 27-30, 2023 Austrochip Workshop on Microelectronics, Graz, Austria, 20/09/23. https://doi.org/10.1109/Austrochip61217.2023.10285162

@inproceedings{32ef68ecc9eb4872b4cbdbc8b911cad4,

title = "Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise",

abstract = "The Random Telegraph Noise (RTN) is one of the major reliability concerns in nanoscale CMOS technologies. In this paper, we discuss the characterization of RTN in 40 nm CMOS technology using Ring Oscillators (ROSCs). We used two different types of ROSCs to study the temporal and spectral characteristics of the RTN. With this work, we analyse the suitability of the two types of ROSC for on chip statistical analysis of the RTN amplitude strength and its frequency characteristics. Already the preliminary results, without complete statistical coverage show f/fmax variations of up to 7.18\% which maximize RTN observability. Further, the observed broad variations in normalized phase noise under varying power supply levels in the range of 0.5 V to 1 V indicate that also the bias dependence of RTN centers can be investigated using the ROSC technique.",

keywords = "Jitter, Oxide-trap, Random Telegraph Noise, Ring Oscillator, RTN",

author = "Semih Ramazanoglu and Alicja Michalowska-Forsyth and Bernd Deutschmann",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 Austrochip Workshop on Microelectronics : Austrochip 2023, Austrochip 2023 ; Conference date: 20-09-2023 Through 21-09-2023",

year = "2023",

doi = "10.1109/Austrochip61217.2023.10285162",

language = "English",

pages = "27--30",

booktitle = "2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise

AU - Ramazanoglu, Semih

AU - Michalowska-Forsyth, Alicja

AU - Deutschmann, Bernd

PY - 2023

Y1 - 2023

N2 - The Random Telegraph Noise (RTN) is one of the major reliability concerns in nanoscale CMOS technologies. In this paper, we discuss the characterization of RTN in 40 nm CMOS technology using Ring Oscillators (ROSCs). We used two different types of ROSCs to study the temporal and spectral characteristics of the RTN. With this work, we analyse the suitability of the two types of ROSC for on chip statistical analysis of the RTN amplitude strength and its frequency characteristics. Already the preliminary results, without complete statistical coverage show f/fmax variations of up to 7.18% which maximize RTN observability. Further, the observed broad variations in normalized phase noise under varying power supply levels in the range of 0.5 V to 1 V indicate that also the bias dependence of RTN centers can be investigated using the ROSC technique.

AB - The Random Telegraph Noise (RTN) is one of the major reliability concerns in nanoscale CMOS technologies. In this paper, we discuss the characterization of RTN in 40 nm CMOS technology using Ring Oscillators (ROSCs). We used two different types of ROSCs to study the temporal and spectral characteristics of the RTN. With this work, we analyse the suitability of the two types of ROSC for on chip statistical analysis of the RTN amplitude strength and its frequency characteristics. Already the preliminary results, without complete statistical coverage show f/fmax variations of up to 7.18% which maximize RTN observability. Further, the observed broad variations in normalized phase noise under varying power supply levels in the range of 0.5 V to 1 V indicate that also the bias dependence of RTN centers can be investigated using the ROSC technique.

KW - Jitter

KW - Oxide-trap

KW - Random Telegraph Noise

KW - Ring Oscillator

KW - RTN

UR - https://www.scopus.com/pages/publications/85176137459

U2 - 10.1109/Austrochip61217.2023.10285162

DO - 10.1109/Austrochip61217.2023.10285162

M3 - Conference paper

AN - SCOPUS:85176137459

SP - 27

EP - 30

BT - 2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings

PB - IEEE

T2 - 2023 Austrochip Workshop on Microelectronics

Y2 - 20 September 2023 through 21 September 2023

ER -

Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise

Abstract

Workshop

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this