Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

Varvara Bezhenova; Alicja Malgorzata Michalowska-Forsyth

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

Varvara Bezhenova
, Alicja Malgorzata Michalowska-Forsyth

Institute of Electronics (4390)

Research output: Contribution to conference › Poster

Abstract

Original language	English
Publication status	Published - 2017
Event	The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications - Leibniz Rechenzentrum, Garching, Germany Duration: 23 Oct 2017 → 26 Oct 2017 Conference number: 13 https://seressa.in.tum.de/

Workshop

Workshop	The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications
Abbreviated title	SERESSA 2017
Country/Territory	Germany
City	Garching
Period	23/10/17 → 26/10/17
Internet address	https://seressa.in.tum.de/

Keywords

Total Ionizing Dose
MOS
X-ray
Integrated circuits

Fields of Expertise

Information, Communication & Computing

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180nm MiAMoRE test chip
Bezhenova, V. (Speaker) & Michalowska-Forsyth, A. M. (Speaker)
23 Oct 2017 → 26 Oct 2017
Activity: Talk or presentation › Poster presentation › Science to science

Cite this

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip. / Bezhenova, Varvara; Michalowska-Forsyth, Alicja Malgorzata.
2017. Poster session presented at The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, Garching, Germany.

Research output: Contribution to conference › Poster

@conference{179410e6e3274e6fb91fd12a705fe9b4,

title = "Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip",

keywords = "Total Ionizing Dose, MOS, X-ray, Integrated circuits",

author = "Varvara Bezhenova and Michalowska-Forsyth, \{Alicja Malgorzata\}",

year = "2017",

language = "English",

note = "The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications, SERESSA 2017 ; Conference date: 23-10-2017 Through 26-10-2017",

url = "https://seressa.in.tum.de/",

}

TY - CONF

T1 - Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

AU - Bezhenova, Varvara

AU - Michalowska-Forsyth, Alicja Malgorzata

N1 - Conference code: 13

PY - 2017

Y1 - 2017

KW - Total Ionizing Dose

KW - MOS

KW - X-ray

KW - Integrated circuits

M3 - Poster

T2 - The 13th International School on the Effects of Radiation on Embedded Systems for Space Applications

Y2 - 23 October 2017 through 26 October 2017

ER -

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180 nm MiAMoRE test chip

Abstract

Workshop

Keywords

Fields of Expertise

Activities

Modelling of equivalent channel dimensions of enclosed-layout transistors, integrated on 180nm MiAMoRE test chip

Cite this