Markov Random Fields for Pattern Extraction in Analog Wafer Test Data

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	German
Title of host publication	International Conference on Image Processing Theory, Tools and Applications (IPTA 2017)
Publication status	Published - 2017

Fields of Expertise

@inproceedings{f533a16fe5cd42408038c3037edd39b4,

title = "Markov Random Fields for Pattern Extraction in Analog Wafer Test Data",

author = "Stefan Schrunner and Olivia Bluder and Anja Zernig and Andre Kaestner and Roman Kern",

year = "2017",

language = "deutsch",

booktitle = "International Conference on Image Processing Theory, Tools and Applications (IPTA 2017)",

}