@inproceedings{60328a553af040878390d8e3145d7bc9,
title = "Low Self-Distortion Test Fixture for Contact Harmonic and Passive Intermodulation Measurement",
abstract = "Interference, as caused by metal-metal contact induced harmonic and passive intermodulation distortion, presents a significant challenge to the mobile device industry. Though previous efforts have established a solid foundation for the systematic study of contact harmonics, the test fixtures used have proven to be a source of significant measurement uncertainty. Specifically, the mechanical instability associated with compressing the sample-holder PCBs causes issues in signal and force measurement. We propose a rigid, horizontally mounted test fixture, reducing excessive degrees of freedom and effectively eliminating the uncertainties from sample mounting and positioning seen in other geometries.",
keywords = "Geometry, Intermodulation distortion, Systematics, Contacts, Fixtures, Harmonic analysis, Mobile handsets, Harmonic distortion, Distortion measurement, Springs, Metal-metal connections, Mobile devices, Passive intermodulation, Test fixture",
author = "Oleksii Shekhovtsov and Rui Mi and Leonhard Petzel and Harun Sido and David Pommerenke",
year = "2024",
month = sep,
day = "5",
doi = "10.1109/EMCEurope59828.2024.10722519",
language = "English",
isbn = "979-8-3503-4304-5",
series = "Proceedings of the International Symposium on Electromagnetic Compatibility, EMC Europe",
publisher = "IEEE CS",
pages = "312--316",
booktitle = "2024 International Symposium on Electromagnetic Compatibility – EMC Europe",
note = "2024 International Symposium on Electromagnetic Compatibility – EMC Europe ; Conference date: 02-09-2024 Through 05-09-2024",
}