Learning-Based Testing of an Industrial Measurement Device

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings
Publisher	Springer
Pages	1-18
Publication status	Published - 2019

Name	Lecture Notes in Computer Science
Volume	11460

Cite this

Learning-Based Testing of an Industrial Measurement Device. / Aichernig, Bernhard; Burghard, Christian; Korosec, Robert.
NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings. Springer, 2019. p. 1-18 (Lecture Notes in Computer Science; Vol. 11460).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

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BT - NASA Formal Methods - 11th International Symposium, NFM 2019, Houston, TX, USA, May 7-9, 2019, Proceedings

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