In situ nanoscale characterisation of electrical and magnetic properties of 3D nanostructures by combination of AFM, SEM and FIB

Research output: Contribution to conference › Abstract

Original language	German
Pages	515-516
Number of pages	2
Publication status	Published - 2021
Event	2021 Microscopy Conference: MC 2021 - Virtuell, Austria Duration: 22 Aug 2021 → 26 Aug 2021

ASJC Scopus subject areas

@conference{ce7e1de40083474d964abe3dbd9b2fa7,

title = "In situ nanoscale characterisation of electrical and magnetic properties of 3D nanostructures by combination of AFM, SEM and FIB",

author = "C. Schwalb and Johanna H{\"u}tner and H. Frerichs and M. Wolff and G. Fantner and Harald Plank",

year = "2021",

language = "deutsch",

pages = "515--516",

note = "2021 Microscopy Conference : MC 2021, MC 2021 ; Conference date: 22-08-2021 Through 26-08-2021",

}

TY - CONF

T1 - In situ nanoscale characterisation of electrical and magnetic properties of 3D nanostructures by combination of AFM, SEM and FIB

AU - Schwalb, C.

AU - Hütner, Johanna

AU - Frerichs, H.

AU - Wolff, M.

AU - Fantner, G.

AU - Plank, Harald

PY - 2021

Y1 - 2021

M3 - Abstract

SP - 515

EP - 516

T2 - 2021 Microscopy Conference

Y2 - 22 August 2021 through 26 August 2021

ER -