How to Use Sensitivity Analysis for EMI Screening in LTspice

Research output: Contribution to conference › Poster › peer-review

Original language	English
Pages	82
Number of pages	1
Publication status	Published - 24 Sept 2025
Event	22. EMV Fachtagung 2025 - Seibersdorf Labor GmbH, Seibersdorf , Austria Duration: 23 Sept 2025 → 25 Sept 2025 https://www.seibersdorf-laboratories.at/index.php?id=946&L=0 https://www.seibersdorf-laboratories.at/emv-fachtagung

Conference	22. EMV Fachtagung 2025
Country/Territory	Austria
City	Seibersdorf
Period	23/09/25 → 25/09/25
Internet address	https://www.seibersdorf-laboratories.at/index.php?id=946&L=0 https://www.seibersdorf-laboratories.at/emv-fachtagung

Fields of Expertise

Best Poster Award
Odreitz, K. (Recipient) & Deutschmann, B. (Recipient), 25 Sept 2025
Prize: Prizes / Medals / Awards

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title = "How to Use Sensitivity Analysis for EMI Screening in LTspice",

author = "Ko Odreitz and Bernd Deutschmann",

note = "OVE Schriftenreihe Nr. 116 ISBN 978-3-903249-28-8; 22. EMV Fachtagung 2025 ; Conference date: 23-09-2025 Through 25-09-2025",

year = "2025",

month = sep,

day = "24",

language = "English",

pages = "82",

url = "https://www.seibersdorf-laboratories.at/index.php?id=946\&L=0, https://www.seibersdorf-laboratories.at/emv-fachtagung",

}