| Original language | English |
|---|---|
| Title of host publication | Proc. IEEE VAST |
| Number of pages | 12 |
| Publication status | Published - 2019 |
Fields of Expertise
- Information, Communication & Computing
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FDive: Learning Relevance Models using Pattern-based Similarity Measures
- F. Dennig
- , T. Polk
- , Z. Lin
- , T. Schreck
- , H.-P. Pfister
- , M. Behrisch
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review