Electrically detected magnetic resonance study of defects created by hot carrier stress at the SiC/SiO2 interface of a SiC n-channel metal-oxide-semiconductor field-effect transistor

Gernot Gruber; Peter Hadley; Markus Koch; Thomas Aichinger

doi:10.1063/1.4891847

Electrically detected magnetic resonance study of defects created by hot carrier stress at the SiC/SiO2 interface of a SiC n-channel metal-oxide-semiconductor field-effect transistor

Gernot Gruber, Peter Hadley, Markus Koch, Thomas Aichinger

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	043506-043506
Journal	Applied Physics Letters
Volume	105
DOIs	https://doi.org/10.1063/1.4891847
Publication status	Published - 2014

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Advanced Materials Science

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Experimental

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10.1063/1.4891847

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title = "Electrically detected magnetic resonance study of defects created by hot carrier stress at the SiC/SiO2 interface of a SiC n-channel metal-oxide-semiconductor field-effect transistor",

author = "Gernot Gruber and Peter Hadley and Markus Koch and Thomas Aichinger",

year = "2014",

doi = "10.1063/1.4891847",

language = "English",

volume = "105",

pages = "043506--043506",

journal = "Applied Physics Letters",

issn = "1077-3118 ",

publisher = "American Institute of Physics Publising LLC",

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TY - JOUR

T1 - Electrically detected magnetic resonance study of defects created by hot carrier stress at the SiC/SiO2 interface of a SiC n-channel metal-oxide-semiconductor field-effect transistor

AU - Gruber, Gernot

AU - Hadley, Peter

AU - Koch, Markus

AU - Aichinger, Thomas

PY - 2014

Y1 - 2014

UR - http://dx.doi.org/10.1063/1.4891847

U2 - 10.1063/1.4891847

DO - 10.1063/1.4891847

M3 - Article

SN - 1077-3118

VL - 105

SP - 43506

EP - 43506

JO - Applied Physics Letters

JF - Applied Physics Letters

ER -

Electrically detected magnetic resonance study of defects created by hot carrier stress at the SiC/SiO2 interface of a SiC n-channel metal-oxide-semiconductor field-effect transistor

Fields of Expertise

Treatment code (Nähere Zuordnung)

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