Activities per year
Abstract
In this work, we investigate the impact of ionising radiation on the robustness towards electromagnetic interference (EMI) of operational amplifiers (OpAmps). Therefore we irradiate two OpAmps, one including a standard differential input stage structure, the other OpAmp featuring a second cross-coupled double differential input pair added to the standard input stage structure. We perform measurements on the manufactured test chip structures to determine general characteristics (gain, offset, gain-bandwidth product (GBWP) and phase margin), as well as EMI-related characteristics like EMI-induced offset and electromagnetic interference rejection ratio (EMIRR). Based on these characteristics, we compare both structures with regard to their performance prior to, during and after irradiation with X-rays. We observe a change in the EMIRR performance with increasing ionising dose. Finally, we explain our observations by taking into account transistor-level effects.
| Original language | English |
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| Title of host publication | 2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2024 |
| Publisher | IEEE |
| Pages | 111-115 |
| Number of pages | 5 |
| ISBN (Electronic) | 9798331504632 |
| DOIs | |
| Publication status | Published - Oct 2024 |
| Event | 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2024 - Torino, Italy, Turin, Italy Duration: 7 Oct 2024 → 9 Oct 2024 |
Publication series
| Name | 2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2024 |
|---|
Conference
| Conference | 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2024 |
|---|---|
| Abbreviated title | EMC Compo |
| Country/Territory | Italy |
| City | Turin |
| Period | 7/10/24 → 9/10/24 |
Keywords
- Combined EMC testing
- Electromagnetic Compatibility (EMC)
- Electromagnetic Immunity
- Electromagnetic In-tereference (EMI)
- EMI Rejection Ratio (EMIRR)
- Radiation Hardness
- Total Ionizing Dose
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Safety, Risk, Reliability and Quality
- Radiation
Fingerprint
Dive into the research topics of 'Effects of Ionizing Radiation on the EMI-Induced Offset Voltage of Operational Amplifiers'. Together they form a unique fingerprint.Activities
- 1 Conference or symposium (Participation in/Organisation of)
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14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2024
Zupan, D. (Participant), Czepl, N. (Participant), Deutschmann, B. (Member of programme committee), Pfeifer, M. (Participant), Kircher, D. (Participant) & Hameed, M. (Participant)
7 Oct 2024 → 9 Oct 2024Activity: Participation in or organisation of › Conference or symposium (Participation in/Organisation of)
Research output
- 1 Conference paper
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Characterisation of an EMI-Improved Integrated Folded Cascode Amplifier Structure Using the EMIRR Measurement Method
Zupan, D., Czepl, N. & Deutschmann, B., Oct 2024, 2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2024. IEEE, p. 1-4 4 p. (2024 14th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, EMC Compo 2024).Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review