Dose Rate Effects in MOS Transistors

Varvara Bezhenova
, Alicja Malgorzata Michalowska-Forsyth

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper

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Finished
FWF - Robust IC - Studies of robustness of analog integrated circuits
Michalowska-Forsyth, A. M. (Project manager on research unit)
4/05/15 → 3/11/19
Project: Research project