Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data

Steffen Holland; Simon Rauchel; Guido Notermans; Yang Xu; Li Shen; Daryl Beetner; David Pommerenke

Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data

Steffen Holland^*
, Simon Rauchel
, Guido Notermans
, Yang Xu
, Li Shen
, Daryl Beetner
, David Pommerenke

^*Corresponding author for this work

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Abstract

A method for calculating the peak voltage at the input of the IC is presented for an I/O port subsystem consisting of a TVS protection device, an IC on-chip protection and a PCB trace. The method is valid for non-snapback on-chip protection where the silicon part can be fully described by a quasistatic (VF)-TLP curve and allows to determine the peak voltage from measurement data of the individual components only.

Original language	English
Title of host publication	Electrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings
Publisher	ESD Association
ISBN (Electronic)	9781585373406
Publication status	Published - 2022
Event	44th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2022 - Reno, United States Duration: 18 Sept 2022 → 23 Sept 2022

Conference

Conference	44th Annual Electrical Overstress/Electrostatic Discharge Symposium
Country/Territory	United States
City	Reno
Period	18/09/22 → 23/09/22

ASJC Scopus subject areas

Electrical and Electronic Engineering

Cite this

Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data. / Holland, Steffen; Rauchel, Simon; Notermans, Guido et al.
Electrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings. ESD Association, 2022.

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Holland, S, Rauchel, S, Notermans, G, Xu, Y, Shen, L, Beetner, D & Pommerenke, D 2022, Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data. in Electrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings. ESD Association, 44th Annual Electrical Overstress/Electrostatic Discharge Symposium, Reno, United States, 18/09/22.

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abstract = "A method for calculating the peak voltage at the input of the IC is presented for an I/O port subsystem consisting of a TVS protection device, an IC on-chip protection and a PCB trace. The method is valid for non-snapback on-chip protection where the silicon part can be fully described by a quasistatic (VF)-TLP curve and allows to determine the peak voltage from measurement data of the individual components only.",

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AU - Holland, Steffen

AU - Rauchel, Simon

AU - Notermans, Guido

AU - Xu, Yang

AU - Shen, Li

AU - Beetner, Daryl

AU - Pommerenke, David

PY - 2022

Y1 - 2022

N2 - A method for calculating the peak voltage at the input of the IC is presented for an I/O port subsystem consisting of a TVS protection device, an IC on-chip protection and a PCB trace. The method is valid for non-snapback on-chip protection where the silicon part can be fully described by a quasistatic (VF)-TLP curve and allows to determine the peak voltage from measurement data of the individual components only.

AB - A method for calculating the peak voltage at the input of the IC is presented for an I/O port subsystem consisting of a TVS protection device, an IC on-chip protection and a PCB trace. The method is valid for non-snapback on-chip protection where the silicon part can be fully described by a quasistatic (VF)-TLP curve and allows to determine the peak voltage from measurement data of the individual components only.

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BT - Electrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings

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T2 - 44th Annual Electrical Overstress/Electrostatic Discharge Symposium

Y2 - 18 September 2022 through 23 September 2022

ER -

Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data

Abstract

Conference

ASJC Scopus subject areas

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