Debugging with Timed Automata Mutations

Bernhard Aichernig; Klaus Hörmaier; Florian Lukas Lorber

doi:10.1007/978-3-319-10506-2_4

Debugging with Timed Automata Mutations

Bernhard Aichernig
, Klaus Hörmaier
, Florian Lukas Lorber

Institute of Software Engineering and Artificial Intelligence (7160)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	Computer Safety, Reliability, and Security
Editors	Andrea Bondavalli, Felicita Di Giandomenico
Publisher	Springer International Publishing AG
Pages	49-64
Volume	8666
ISBN (Print)	978-3-319-10506-2
DOIs	https://doi.org/10.1007/978-3-319-10506-2_4
Publication status	Published - 2014
Event	International Conference on Computer Safety, Reliability and Security - Florenz, Italy Duration: 10 Sept 2014 → 12 Sept 2014

Publication series

Name	Lecture Notes in Computer Science
Publisher	Springer International Publishing

Conference

Conference	International Conference on Computer Safety, Reliability and Security
Country/Territory	Italy
City	Florenz
Period	10/09/14 → 12/09/14

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Application
Theoretical

Access to Document

10.1007/978-3-319-10506-2_4

Cite this

Debugging with Timed Automata Mutations. / Aichernig, Bernhard; Hörmaier, Klaus; Lorber, Florian Lukas.
Computer Safety, Reliability, and Security. ed. / Andrea Bondavalli; Felicita Di Giandomenico. Vol. 8666 Springer International Publishing AG , 2014. p. 49-64 (Lecture Notes in Computer Science).

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Aichernig, B, Hörmaier, K & Lorber, FL 2014, Debugging with Timed Automata Mutations. in A Bondavalli & F Di Giandomenico (eds), Computer Safety, Reliability, and Security. vol. 8666, Lecture Notes in Computer Science, Springer International Publishing AG , pp. 49-64, International Conference on Computer Safety, Reliability and Security, Florenz, Italy, 10/09/14. https://doi.org/10.1007/978-3-319-10506-2_4

@inproceedings{a87d2d1fd22949409b8509d98761c82e,

title = "Debugging with Timed Automata Mutations",

author = "Bernhard Aichernig and Klaus H{\"o}rmaier and Lorber, \{Florian Lukas\}",

year = "2014",

doi = "10.1007/978-3-319-10506-2\_4",

language = "English",

isbn = "978-3-319-10506-2",

volume = "8666",

series = "Lecture Notes in Computer Science",

publisher = "Springer International Publishing AG ",

pages = "49--64",

editor = "Andrea Bondavalli and \{Di Giandomenico\}, Felicita",

booktitle = "Computer Safety, Reliability, and Security",

address = "Switzerland",

note = "International Conference on Computer Safety, Reliability and Security ; Conference date: 10-09-2014 Through 12-09-2014",

}

TY - GEN

T1 - Debugging with Timed Automata Mutations

AU - Aichernig, Bernhard

AU - Hörmaier, Klaus

AU - Lorber, Florian Lukas

PY - 2014

Y1 - 2014

UR - http://dx.doi.org/10.1007/978-3-319-10506-2_4

U2 - 10.1007/978-3-319-10506-2_4

DO - 10.1007/978-3-319-10506-2_4

M3 - Conference paper

SN - 978-3-319-10506-2

VL - 8666

T3 - Lecture Notes in Computer Science

SP - 49

EP - 64

BT - Computer Safety, Reliability, and Security

A2 - Bondavalli, Andrea

A2 - Di Giandomenico, Felicita

PB - Springer International Publishing AG

T2 - International Conference on Computer Safety, Reliability and Security

Y2 - 10 September 2014 through 12 September 2014

ER -

Debugging with Timed Automata Mutations

Publication series

Conference

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Other files and links

CRYSTAL - Critical Systems Engineering Factories

EU - MBAT - Combined Model-based Analysis and Testing of Embedded Systems

Formal Methods

Cite this

Debugging with Timed Automata Mutations

Publication series

Conference

Fields of Expertise

Treatment code (Nähere Zuordnung)

Access to Document

Other files and links

Projects

CRYSTAL - Critical Systems Engineering Factories

EU - MBAT - Combined Model-based Analysis and Testing of Embedded Systems

Formal Methods

Cite this