Correlative microscopy and machine learning –new tools for material characterization

Harald Matthias Fitzek; Ruth Schmidt; Manfred Nachtnebel; Johannes Rattenberger; Armin Zankel; Ferdinand Hofer; Hartmuth Schröttner

Correlative microscopy and machine learning –new tools for material characterization

Institute of Electron Microscopy and Nanoanalysis (5190)

Research output: Contribution to conference › Abstract › peer-review

Original language	English
Pages	HM 114
Number of pages	1
Publication status	Published - 2022
Event	20th Plansee Seminar - Reutte, Austria Duration: 29 May 2022 → 3 Jun 2022

Conference

Conference	20th Plansee Seminar
Country/Territory	Austria
City	Reutte
Period	29/05/22 → 3/06/22

ASJC Scopus subject areas

General Materials Science

Fields of Expertise

Advanced Materials Science

Treatment code (Nähere Zuordnung)

Basic - Fundamental (Grundlagenforschung)

Cite this

@conference{bff41bdaea994be6abef5bb3e45e475d,

title = "Correlative microscopy and machine learning –new tools for material characterization",

author = "Fitzek, \{Harald Matthias\} and Ruth Schmidt and Manfred Nachtnebel and Johannes Rattenberger and Armin Zankel and Ferdinand Hofer and Hartmuth Schr{\"o}ttner",

year = "2022",

language = "English",

pages = "HM 114",

note = "20th Plansee Seminar ; Conference date: 29-05-2022 Through 03-06-2022",

}

TY - CONF

T1 - Correlative microscopy and machine learning –new tools for material characterization

AU - Fitzek, Harald Matthias

AU - Schmidt, Ruth

AU - Nachtnebel, Manfred

AU - Rattenberger, Johannes

AU - Zankel, Armin

AU - Hofer, Ferdinand

AU - Schröttner, Hartmuth

PY - 2022

Y1 - 2022

M3 - Abstract

SP - HM 114

T2 - 20th Plansee Seminar

Y2 - 29 May 2022 through 3 June 2022

ER -