Correlation between systemlevel robustness and TLP results of ESD devices

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

Original language	English
Title of host publication	International Electrostatic Discharge Workshop
Publisher	.
Pages	---
Publication status	Published - 2011
Event	International Electrostatic Discharge Workshop - Lake Tahoe, CA, United States Duration: 16 May 2011 → 19 May 2011

Conference	International Electrostatic Discharge Workshop
Country/Territory	United States
City	Lake Tahoe, CA
Period	16/05/11 → 19/05/11

Fields of Expertise

@inproceedings{9d77f6c0675349c8afaaa196de380387,

title = "Correlation between systemlevel robustness and TLP results of ESD devices",

author = "Bernd Deutschmann and Filippo Magrini and Y. Cao and M. Mayerhofer",

year = "2011",

language = "English",

pages = "------",

booktitle = "International Electrostatic Discharge Workshop",

publisher = ".",

note = "International Electrostatic Discharge Workshop ; Conference date: 16-05-2011 Through 19-05-2011",

}

TY - GEN

T1 - Correlation between systemlevel robustness and TLP results of ESD devices

AU - Deutschmann, Bernd

AU - Magrini, Filippo

AU - Cao, Y.

AU - Mayerhofer, M.

PY - 2011

Y1 - 2011

M3 - Conference paper

SP - ---

BT - International Electrostatic Discharge Workshop

PB - .

T2 - International Electrostatic Discharge Workshop

Y2 - 16 May 2011 through 19 May 2011

ER -