Activities per year
Abstract
Modern Gallium Nitride (GaN) based switching converters benefit from the device’s high switching speeds which also result in high du/dt transitions. This leads to fast-switching nodes which can often be a source of unwanted electromagnetic interference e.g. caused by common mode currents. Some best-practice design guidelines recommend using common mode chokes for example at the supply pins of isolated high-side supplies or even the gate driver’s input pins.
This poster will summarize possible sources of electromagnetic interference and investigate the effectiveness of recommended mitigation techniques based on practical design examples.
This poster will summarize possible sources of electromagnetic interference and investigate the effectiveness of recommended mitigation techniques based on practical design examples.
| Original language | English |
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| Pages | 78 |
| Number of pages | 1 |
| Publication status | Published - Sept 2025 |
| Event | 22. EMV Fachtagung 2025 - Seibersdorf Labor GmbH, Seibersdorf , Austria Duration: 23 Sept 2025 → 25 Sept 2025 https://www.seibersdorf-laboratories.at/index.php?id=946&L=0 https://www.seibersdorf-laboratories.at/emv-fachtagung |
Conference
| Conference | 22. EMV Fachtagung 2025 |
|---|---|
| Country/Territory | Austria |
| City | Seibersdorf |
| Period | 23/09/25 → 25/09/25 |
| Internet address |
Fields of Expertise
- Sonstiges
Fingerprint
Dive into the research topics of 'Common Mode Chokes and GaN Highside-Drivers – Investigating Best Practice EMC Design Guidelines for GaN-based Switching Converters'. Together they form a unique fingerprint.Activities
- 1 Talk at conference or symposium
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Common Mode Chokes and GaN Highside-Drivers – Investigating Best Practice EMC Design Guidelines for GaN-based Switching Converters
Juch, N. (Speaker) & Deutschmann, B. (Contributor)
24 Sept 2025Activity: Talk or presentation › Talk at conference or symposium › Science to science