Commercial USB IC Soft-Failure Sensitivity Measurement Method and Trend Analysis
- Runbing Hua
- , Omid Hoseini Izadi
- , Zhekun Peng
- , Hideki Shumiya
- , Shota Konno
- , Kenji Araki
- , David Johannes Pommerenke
- , DongHyun Kim
Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review