Characterising Soft-Failures in Component-Level ESD Testing

Patrick Schrey

Institute of Electronics (4390)

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

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14th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2018
Schrey, P. (Participant)
2 Jul 2018 → 5 Jul 2018
Activity: Participation in or organisation of › Conference or symposium (Participation in/Organisation of)