Characterising Soft-Failures in Component-Level ESD Testing

Research output: Chapter in Book/Report/Conference proceeding › Conference paper › peer-review

14th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2018
Schrey, P. (Participant)
2 Jul 2018 → 5 Jul 2018
Activity: Participation in or organisation of › Conference or symposium (Participation in/Organisation of)
Characterising Soft-Failures in Component-Level ESD Testing
Schrey, P. (Speaker)
3 Jul 2018
Activity: Talk or presentation › Talk at conference or symposium › Science to science

Activities