Activities per year
| Original language | English |
|---|---|
| Title of host publication | 2018 14th Conference on Ph.D. Research in Microelectronics and Electronics (PRIME) |
| Publisher | IEEE Xplore |
| Pages | 93-96 |
| Number of pages | 4 |
| ISBN (Electronic) | 978-1-5386-5387-6 |
| DOIs | |
| Publication status | Published - Jul 2018 |
| Event | 14th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2018: PRIME 2018 - Faculty of Nuclear Sciences and Physical Engineering, Czech Technical University in Prague Brehova 7, Prague 1, Czech Republic, Prague, Slovakia Duration: 2 Jul 2018 → 5 Jul 2018 Conference number: 14 |
Conference
| Conference | 14th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2018 |
|---|---|
| Abbreviated title | PRIME 2018 |
| Country/Territory | Slovakia |
| City | Prague |
| Period | 2/07/18 → 5/07/18 |
Activities
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Characterising Soft-Failures in Component-Level ESD Testing
Schrey, P. (Speaker)
3 Jul 2018Activity: Talk or presentation › Talk at conference or symposium › Science to science
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14th Conference on Ph.D. Research in Microelectronics and Electronics, PRIME 2018
Schrey, P. (Participant)
2 Jul 2018 → 5 Jul 2018Activity: Participation in or organisation of › Conference or symposium (Participation in/Organisation of)