Abstract
Atomic-scale defect detection in complex oxides such as SrTiO₃ (STO) is crucial for optimizing their functional properties. The controlled introduction of dopants and vacancies enables precise tuning of electronic and magnetic behavior, making detailed knowledge of their structural and electronic configurations essential. In this study, we present a comprehensive approach that refines the entire workflow, from advanced sample preparation to sophisticated data analysis, for reliable point defect characterization using aberration-corrected scanning transmission electron microscopy (STEM).
| Original language | English |
|---|---|
| Title of host publication | 17th Multinational Congress on Microscopy: book of abstract |
| Publisher | Slovene Society for Microscopy |
| Chapter | IM3-O-1 |
| Number of pages | 2 |
| ISBN (Electronic) | 978 961 94264 4 9 |
| Publication status | Published - 2025 |
| Event | 17th Multinational Congress on Microscopy, MCM 2025 - Portorož, Slovenia Duration: 8 Sept 2025 → 12 Sept 2025 https://17mcm.si/ |
Conference
| Conference | 17th Multinational Congress on Microscopy, MCM 2025 |
|---|---|
| Abbreviated title | MCM 2025 |
| Country/Territory | Slovenia |
| City | Portorož |
| Period | 8/09/25 → 12/09/25 |
| Internet address |
ASJC Scopus subject areas
- General Materials Science
Fields of Expertise
- Advanced Materials Science
Treatment code (Nähere Zuordnung)
- Basic - Fundamental (Grundlagenforschung)