Abstract
- A new design for CDM testing is proposed that retains the field charging DDT method while providing a consistent discharge inside of a reed switch. The method is shown to adhere to the current JS-002 standard and to perform at low voltages, but JS-002 failures could not be exactly replicated.
| Original language | English |
|---|---|
| Title of host publication | Electrical Overstress/Electrostatic Discharge Symposium 2020, Proceedings - EOS/ESD 2020 |
| Number of pages | 9 |
| ISBN (Electronic) | 978-1-7281-9461-5 |
| Publication status | Published - 13 Sept 2020 |
| Event | 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2020 - Reno, United States Duration: 13 Sept 2020 → 18 Sept 2020 |
Conference
| Conference | 42nd Annual Electrical Overstress/Electrostatic Discharge Symposium |
|---|---|
| Abbreviated title | EOS/ESD 2020 |
| Country/Territory | United States |
| City | Reno |
| Period | 13/09/20 → 18/09/20 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering