A Novel Method for Testing the Electromagnetic Immunity of the Short Circuit Protection Function of Smart Power Switches

  • Daniel Kircher*
  • , Bernd Deutschmann
  • , Heinrich Helldorff
  • *Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference paperpeer-review

Abstract

This paper investigates the robustness of the shortcircuit protection function of automotive smart power switches. These devices are being used more and more in vehicles and are performing more and more safety-related functions. Since a modern car is full of electronics, compliance with the relevant electromagnetic compatibility (EMC) standards is a prerequisite for safe operation. However, the EMC standards do not cover safety functions such as overtemperature or short-circuit protection. This can lead to a potential safety risk in the end product. Therefore, we present a system that combines the short circuit test and the direct power injection (DPI) immunity test to investigate the electromagnetic immunity of the short circuit protection function. We show a new test method, apply it on two representative devices from different manufacturers, and discuss the results. The short-circuit protection function of the tested devices seems to be robust against electromagnetic disturbances, while some weaknesses in the diagnostic output were found, which may lead to a misinterpretation of the failure state of the device under test (DUT).

Original languageEnglish
Title of host publication2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal and Power Integrity
Subtitle of host publicationEMC Japan/Asia Pacific International Symposium on Electromagnetic Compatibility, EMC Japan/APEMC Okinawa 2024 - Proceedings
PublisherIEEE
Pages661-664
Number of pages4
ISBN (Electronic)9784885523472
Publication statusPublished - 2024
Event2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal and Power Integrity: EMC Japan/Asia Pacific International Symposium on Electromagnetic Compatibility, EMC Japan/APEMC Okinawa 2024 - Okinawa, Japan
Duration: 20 May 202424 May 2024

Conference

Conference2024 IEEE Joint International Symposium on Electromagnetic Compatibility, Signal and Power Integrity: EMC Japan/Asia Pacific International Symposium on Electromagnetic Compatibility, EMC Japan/APEMC Okinawa 2024
Country/TerritoryJapan
CityOkinawa
Period20/05/2424/05/24

Keywords

  • combined effects
  • combined testing
  • direct power injection (DPI)
  • electromagnetic compatibility (EMC)
  • electromagnetic immunity
  • functional safety (FS)
  • short circuit

ASJC Scopus subject areas

  • Hardware and Architecture
  • Signal Processing
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering
  • Safety, Risk, Reliability and Quality
  • Radiation

Fingerprint

Dive into the research topics of 'A Novel Method for Testing the Electromagnetic Immunity of the Short Circuit Protection Function of Smart Power Switches'. Together they form a unique fingerprint.

Cite this