A Modular Test System for Conducted Electromagnetic Compatibility of Integrated Circuits

Simon Profanter
, Daniel Kircher
, Jan Hansen

Institute of Electronics (4390)

Research output: Contribution to conference › Poster

1 results

2025
A Modular Approach of an Electromagnetic Compatibility Test System for Integrated Circuits
Profanter, S., Apr 2025, 68 p.
Research output: Thesis › Master's Thesis