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Perspective on defects in nanoscale MOSFET from the ionizing radiation experiments

Activity: Talk or presentationInvited talkScience to science

Period17 Nov 2025
Held atInstitute of Solid State Physics (5130)
Degree of RecognitionNational

Keywords

  • CMOS
  • Defects
  • Random Telegraph Noise
  • Interface Traps
  • Oxide Traps

Fields of Expertise

  • Advanced Materials Science