Abstract
With the increasing complexity of electronic systems and their miniaturization, Electromagnetic Compatibility (EMC) concerns have increased due to the higher switching frequencies of buck/boost power converters. Electromagnetic Interference filters are used to comply with EMC limits. However, the optimal to-the-limit design of such a power system is difficult due to the large number of involved parameters which, in case of complex EMC simulation models, lead to prohibitively long simulation times. This paper develops a method based on wide-band surrogate models of a half bridge buck converter and its EMI filter, which is fast enough to allow 10,000 system evaluations in 4 minutes with an octa-core laptop. With the surrogate models, we demonstrate the feasibility of Multi-Objective Optimization (MOO) for minimizing common-mode emission and the size of the filter's common-mode choke. A computational advantage over LTspice simulations of at least 400 times has been achieved.
| Originalsprache | englisch |
|---|---|
| Titel | 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility, APEMC/INCEMIC 2023 |
| Herausgeber (Verlag) | IEEE |
| ISBN (elektronisch) | 9798350338348 |
| DOIs | |
| Publikationsstatus | Veröffentlicht - 2023 |
| Veranstaltung | 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility: APEMC/INCEMIC 2023 - Bengaluru, Indien Dauer: 22 Mai 2023 → 25 Mai 2023 |
Konferenz
| Konferenz | 2023 Joint Asia-Pacific International Symposium on Electromagnetic Compatibility and International Conference on ElectroMagnetic Interference and Compatibility |
|---|---|
| Kurztitel | APEMC/INCEMIC 2023 |
| Land/Gebiet | Indien |
| Ort | Bengaluru |
| Zeitraum | 22/05/23 → 25/05/23 |
ASJC Scopus subject areas
- Computernetzwerke und -kommunikation
- Elektrotechnik und Elektronik
- Sicherheit, Risiko, Zuverlässigkeit und Qualität
- Elektronische, optische und magnetische Materialien
- Instrumentierung
- Strahlung
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