Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress

Michael Fuchs; Markus Sievers; Bernd Deutschmann

doi:10.1109/APEC39645.2020.9124365

Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress

Titel in Übersetzung: Spannungsabhängigkeit und Charakterisierung von Keramik-Kondensatoren unter elektrischer Beanspruchung

Michael Fuchs
, Markus Sievers
, Bernd Deutschmann

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.

Titel in Übersetzung	Spannungsabhängigkeit und Charakterisierung von Keramik-Kondensatoren unter elektrischer Beanspruchung
Originalsprache	englisch
Titel	APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition
Herausgeber (Verlag)	IEEE
Seiten	2815-2821
Seitenumfang	7
ISBN (elektronisch)	9781728148298
DOIs	https://doi.org/10.1109/APEC39645.2020.9124365
Publikationsstatus	Veröffentlicht - März 2020
Veranstaltung	35th Annual IEEE Applied Power Electronics Conference and Exposition: APEC 2020 - New Orleans, USA / Vereinigte Staaten Dauer: 15 März 2020 → 19 März 2020

Konferenz

Konferenz	35th Annual IEEE Applied Power Electronics Conference and Exposition
Kurztitel	APEC 2020
Land/Gebiet	USA / Vereinigte Staaten
Ort	New Orleans
Zeitraum	15/03/20 → 19/03/20

ASJC Scopus subject areas

Elektrotechnik und Elektronik

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Application

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10.1109/APEC39645.2020.9124365

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Fuchs, M, Sievers, M & Deutschmann, B 2020, Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress. in APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition., 9124365, IEEE, S. 2815-2821, 35th Annual IEEE Applied Power Electronics Conference and Exposition, New Orleans, USA / Vereinigte Staaten, 15/03/20. https://doi.org/10.1109/APEC39645.2020.9124365

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title = "Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress",

abstract = "This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.",

keywords = "Accelerated Stress Testing, Degradation, EMI simulations, High Frequency Behavior, High Voltage, Impedance Characterization, MLCC aging, Modelling",

author = "Michael Fuchs and Markus Sievers and Bernd Deutschmann",

note = "Publisher Copyright: {\textcopyright} 2020 IEEE.; 35th Annual IEEE Applied Power Electronics Conference and Exposition : APEC 2020, APEC 2020 ; Conference date: 15-03-2020 Through 19-03-2020",

year = "2020",

month = mar,

doi = "10.1109/APEC39645.2020.9124365",

language = "English",

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booktitle = "APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition",

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AU - Fuchs, Michael

AU - Sievers, Markus

AU - Deutschmann, Bernd

PY - 2020/3

Y1 - 2020/3

N2 - This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.

AB - This paper covers the effects of multi-layer ceramic capacitors (MLCC) and their frequency response after having been subjected to excessive electrical stress. For this purpose, a measurement system is presented which allows a precise measurement of the impedance curve up to frequencies of 1 GHz with simultaneous application of DC voltages up to 300 V. In addition, the paper presents a stress test system which stresses the capacitors with pulses up to 300 V and 30 A. The study examines the effects of these stress tests on the behavior of the MLCCs. The findings can be used in simulation of electromagnetic emissions where one might need to take the degradation of components due to aging into account.

KW - Accelerated Stress Testing

KW - Degradation

KW - EMI simulations

KW - High Frequency Behavior

KW - High Voltage

KW - Impedance Characterization

KW - MLCC aging

KW - Modelling

UR - https://www.scopus.com/pages/publications/85087768168

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DO - 10.1109/APEC39645.2020.9124365

M3 - Conference paper

AN - SCOPUS:85087768168

SP - 2815

EP - 2821

BT - APEC 2020 - 35th Annual IEEE Applied Power Electronics Conference and Exposition

PB - IEEE

T2 - 35th Annual IEEE Applied Power Electronics Conference and Exposition

Y2 - 15 March 2020 through 19 March 2020

ER -

Voltage Dependence and Characterization of Ceramic Capacitors Under Electrical Stress

Abstract

Konferenz

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

Zugriff auf Dokument

Andere Dateien und Links

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