Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards

Ziad Hatab; Michael Ernst Gadringer; Ahmad Bader Alothman Alterkawi; Wolfgang Bösch

doi:10.1109/OJIM.2023.3315349

Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards

Ziad Hatab^*
, Michael Ernst Gadringer
, Ahmad Bader Alothman Alterkawi
, Wolfgang Bösch

^*Korrespondierende/r Autor/-in für diese Arbeit

Institut für Hochfrequenztechnik (4510)

Publikation: Beitrag in einer Fachzeitschrift › Artikel › Begutachtung

Abstract

This paper presents a new technique for evaluating the consistency of the reference impedance in multiline thru-reflect-line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup.

Originalsprache	englisch
Aufsatznummer	10251578
Seitenumfang	12
Fachzeitschrift	IEEE Open Journal of Instrumentation and Measurement
Jahrgang	2
DOIs	https://doi.org/10.1109/OJIM.2023.3315349
Publikationsstatus	Veröffentlicht - 14 Sept. 2023

Schlagwörter

Calibration
Impedance
Standards
Reflection coefficient
Microstrip
Substrates
Broadband communication

ASJC Scopus subject areas

Instrumentierung
Elektrotechnik und Elektronik
Signalverarbeitung

Fields of Expertise

Information, Communication & Computing

Treatment code (Nähere Zuordnung)

Experimental
Basic - Fundamental (Grundlagenforschung)

Zugriff auf Dokument

10.1109/OJIM.2023.3315349Lizenz: CC BY 4.0

IEEE OJIM - Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance StandardsEndgültige, publizierte Fassung, 7,76 MBLizenz: CC BY 4.0

CD-Labor für Technologie basiertes Design und Charakterisierung von elektronischen Komponenten
Pauser-Greistorfer, C. (Teilnehmer / Mitarbeiter), Maier, C. (Teilnehmer / Mitarbeiter), Paulitsch, H. (Teilnehmer / Mitarbeiter), Takahashi, H. (Teilnehmer / Mitarbeiter), Rezaee, B. (Teilnehmer / Mitarbeiter), Fuchs, M. (Teilnehmer / Mitarbeiter), Gadringer, M. E. (Teilnehmer / Mitarbeiter), Sarbandi Farahani, H. (Teilnehmer / Mitarbeiter), Hatab, Z. (Teilnehmer / Mitarbeiter), Bösch, W. (Konsortialführer/in bzw. Koordinator/in bei Kooperationen mit externen Organisationen) & Bösch, W. (Projektleiter an der OE)
1/11/20 → 31/10/27
Projekt: Forschungsprojekt

Validation of the Reference Impedance in Multiline Calibration With Stepped Impedance Standards
Gadringer, M. E. (Redner/in), Hatab, Z. (Redner/in), Alothman Alterkawi, A. B. (Redner/in) & Bösch, W. (Redner/in)
22 Mai 2024
Aktivität: Vortrag oder Präsentation › Posterpräsentation › Science to science

A Thru-free Multiline Calibration
Hatab, Z., Gadringer, M. E. & Bösch, W., 5 Mai 2023.
Publikation: Arbeitspapier › Preprint

Datei
Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration
Hatab, Z., Gadringer, M. E. & Bösch, W., 22 Jan. 2023, arXiv, 9 S.
Publikation: Arbeitspapier › Preprint

Open Access
Datei
Improving The Reliability of The Multiline TRL Calibration Algorithm
Hatab, Z., Gadringer, M. & Bösch, W., 18 Jan. 2022, 98th ARFTG Microwave Measurement Conference: Non-Linear Methods and Measurements for RF and mm-Wave, ARFTG 2022. ACM/IEEE, S. 1-5 5 S. 9844064. (98th ARFTG Microwave Measurement Conference: Non-Linear Methods and Measurements for RF and mm-Wave, ARFTG 2022).
Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Dieses zitieren

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title = "Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards",

abstract = "This article presents a new technique for evaluating the consistency of the reference impedance in multiline thru–reflect–line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup",

keywords = "Calibration, Impedance, Standards, Reflection coefficient, Microstrip, Substrates, Broadband communication",

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AU - Hatab, Ziad

AU - Gadringer, Michael Ernst

AU - Alterkawi, Ahmad Bader Alothman

AU - Bösch, Wolfgang

PY - 2023/9/14

Y1 - 2023/9/14

N2 - This article presents a new technique for evaluating the consistency of the reference impedance in multiline thru–reflect–line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup

AB - This article presents a new technique for evaluating the consistency of the reference impedance in multiline thru–reflect–line (TRL) calibration. During the calibration process, it is assumed that all transmission line standards have the same characteristic impedance. However, these assumptions are prone to errors due to imperfections, which can affect the validity of the reference impedance after calibration. Our proposed method involves using multiple stepped impedance lines of different lengths to extract the broadband reflection coefficient of the impedance transition. This reflection coefficient can be used to validate the reference impedance experimentally without requiring fully defined standards. We demonstrate this method using multiline TRL based on microstrip structures on a printed circuit board (PCB) with an on-wafer probing setup

KW - Calibration

KW - Impedance

KW - Standards

KW - Reflection coefficient

KW - Microstrip

KW - Substrates

KW - Broadband communication

U2 - 10.1109/OJIM.2023.3315349

DO - 10.1109/OJIM.2023.3315349

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JO - IEEE Open Journal of Instrumentation and Measurement

JF - IEEE Open Journal of Instrumentation and Measurement

M1 - 10251578

ER -

Validation of the Reference Impedance in Multiline Calibration with Stepped Impedance Standards

Abstract

Schlagwörter

ASJC Scopus subject areas

Fields of Expertise

Treatment code (Nähere Zuordnung)

Zugriff auf Dokument

Fingerprint

Projekte

CD-Labor für Technologie basiertes Design und Charakterisierung von elektronischen Komponenten

Aktivitäten

Validation of the Reference Impedance in Multiline Calibration With Stepped Impedance Standards

Publikationen

A Thru-free Multiline Calibration

Propagation of Linear Uncertainties through Multiline Thru-Reflect-Line Calibration

Improving The Reliability of The Multiline TRL Calibration Algorithm

Dieses zitieren