Total Ionizing Dose Effects on Delay Variability of Integrated Circuits with Metastable Transitions - Selected Delay Stages Embedded into 40~nm bulk CMOS Ring Oscillators

Semih Ramazanoglu; Alicja Malgorzata Michalowska-Forsyth

Total Ionizing Dose Effects on Delay Variability of Integrated Circuits with Metastable Transitions - Selected Delay Stages Embedded into 40~nm bulk CMOS Ring Oscillators

Semih Ramazanoglu^*
, Alicja Malgorzata Michalowska-Forsyth

^*Korrespondierende/r Autor/-in für diese Arbeit

Institut für Elektronik (4390)

Publikation: Konferenzbeitrag › Poster › Begutachtung

Originalsprache	englisch
Publikationsstatus	Veröffentlicht - 17 Sept. 2024
Veranstaltung	Radiation and its Effects on Components and Systems - ExpoMeloneras Conference Centre, Maspalomas, Spanien Dauer: 16 Sept. 2024 → 20 Sept. 2024 Konferenznummer: 24th https://radecs2024.org/

Konferenz

Konferenz	Radiation and its Effects on Components and Systems
Kurztitel	RADECS
Land/Gebiet	Spanien
Ort	Maspalomas
Zeitraum	16/09/24 → 20/09/24
Internetadresse	https://radecs2024.org/

ASJC Scopus subject areas

Elektrotechnik und Elektronik

Fields of Expertise

Advanced Materials Science

Dieses zitieren

Total Ionizing Dose Effects on Delay Variability of Integrated Circuits with Metastable Transitions - Selected Delay Stages Embedded into 40~nm bulk CMOS Ring Oscillators. / Ramazanoglu, Semih ; Michalowska-Forsyth, Alicja Malgorzata.
2024. Postersitzung präsentiert bei Radiation and its Effects on Components and Systems, Maspalomas, Spanien.

Publikation: Konferenzbeitrag › Poster › Begutachtung

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title = "Total Ionizing Dose Effects on Delay Variability of Integrated Circuits with Metastable Transitions - Selected Delay Stages Embedded into 40\textasciitilde{}nm bulk CMOS Ring Oscillators",

keywords = "reliability, variability, CMOS, integrated circuit, Total Ionizing Dose, TID",

author = "Semih Ramazanoglu and Michalowska-Forsyth, \{Alicja Malgorzata\}",

year = "2024",

month = sep,

day = "17",

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AU - Ramazanoglu, Semih

AU - Michalowska-Forsyth, Alicja Malgorzata

N1 - Conference code: 24th

PY - 2024/9/17

Y1 - 2024/9/17

KW - reliability

KW - variability

KW - CMOS

KW - integrated circuit

KW - Total Ionizing Dose

KW - TID

M3 - Poster

T2 - Radiation and its Effects on Components and Systems

Y2 - 16 September 2024 through 20 September 2024

ER -