Robustness of ESD Protection Structures against Automotive Transient Disturbances

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	Asia-Pacific Symposium on Electromagnetic Compatibility
Erscheinungsort	Piscataway, NY
Herausgeber (Verlag)	IEEE
Seiten	1039-1042
ISBN (Print)	978-1-4244-5621-5
DOIs	https://doi.org/10.1109/APEMC.2010.5475620
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	Asia-Pacific Symposium on Electromagnetic Compatibility - Bejing, China Dauer: 12 Apr. 2010 → 16 Apr. 2014

Konferenz	Asia-Pacific Symposium on Electromagnetic Compatibility
Land/Gebiet	China
Ort	Bejing
Zeitraum	12/04/10 → 16/04/14

Fields of Expertise

@inproceedings{0e9bb8de1a5546ac96b093f1edf36c7a,

title = "Robustness of ESD Protection Structures against Automotive Transient Disturbances",

author = "Bernd Deutschmann and Filippo Magrini and Yiqun Cao",

year = "2010",

doi = "10.1109/APEMC.2010.5475620",

language = "English",

isbn = "978-1-4244-5621-5",

pages = "1039--1042",

booktitle = "Asia-Pacific Symposium on Electromagnetic Compatibility",

publisher = "IEEE",

address = "United States",

note = "Asia-Pacific Symposium on Electromagnetic Compatibility ; Conference date: 12-04-2010 Through 16-04-2014",

}

TY - GEN

T1 - Robustness of ESD Protection Structures against Automotive Transient Disturbances

AU - Deutschmann, Bernd

AU - Magrini, Filippo

AU - Cao, Yiqun

PY - 2010

Y1 - 2010

U2 - 10.1109/APEMC.2010.5475620

DO - 10.1109/APEMC.2010.5475620

M3 - Conference paper

SN - 978-1-4244-5621-5

SP - 1039

EP - 1042

BT - Asia-Pacific Symposium on Electromagnetic Compatibility

PB - IEEE

CY - Piscataway, NY

T2 - Asia-Pacific Symposium on Electromagnetic Compatibility

Y2 - 12 April 2010 through 16 April 2014

ER -