Pulse Frequency Effects on Probability of ESD Soft Failures for a Specific Camera Subsystem

Yanlin Nie; Qiupei Huang; Xiang Li; Xiaofei Xie; David Johannes Pommerenke; Zhiwei Liu; Jizhi Liu

doi:10.23919/IEDS48938.2021.9468832

Pulse Frequency Effects on Probability of ESD Soft Failures for a Specific Camera Subsystem

Yanlin Nie
, Qiupei Huang
, Xiang Li
, Xiaofei Xie
, David Johannes Pommerenke
, Zhiwei Liu
, Jizhi Liu

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

In this paper, the frequency of injection pulses has been varied to study its influence on soft failure probability. Injection pulses with different frequencies are injected into a camera sub-system of a smartphone prototype. It is found that the pulse frequency is nonlinear with the soft failure probability.

Originalsprache	englisch
Titel	International EOS/ESD Symposium on Design and System 2020, IEDS 2020
Herausgeber (Verlag)	IEEE
ISBN (elektronisch)	9781585373284
DOIs	https://doi.org/10.23919/IEDS48938.2021.9468832
Publikationsstatus	Veröffentlicht - 23 Juni 2021
Veranstaltung	1st Annual International EOS/ESD Symposium on Design and System: IEDS 2020 - Virtuell Dauer: 23 Juni 2020 → 25 Juni 2020

Konferenz

Konferenz	1st Annual International EOS/ESD Symposium on Design and System
Kurztitel	IEDS 2020
Ort	Virtuell
Zeitraum	23/06/20 → 25/06/20

ASJC Scopus subject areas

Elektrotechnik und Elektronik
Elektronische, optische und magnetische Materialien
Instrumentierung
Atom- und Molekularphysik sowie Optik

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10.23919/IEDS48938.2021.9468832

Andere Dateien und Links

https://www.scopus.com/pages/publications/85112868329

Dieses zitieren

Nie, Y, Huang, Q, Li, X, Xie, X, Pommerenke, DJ, Liu, Z & Liu, J 2021, Pulse Frequency Effects on Probability of ESD Soft Failures for a Specific Camera Subsystem. in International EOS/ESD Symposium on Design and System 2020, IEDS 2020., 9468832, IEEE, 1st Annual International EOS/ESD Symposium on Design and System, Virtuell, 23/06/20. https://doi.org/10.23919/IEDS48938.2021.9468832

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title = "Pulse Frequency Effects on Probability of ESD Soft Failures for a Specific Camera Subsystem",

abstract = "In this paper, the frequency of injection pulses has been varied to study its influence on soft failure probability. Injection pulses with different frequencies are injected into a camera sub-system of a smartphone prototype. It is found that the pulse frequency is nonlinear with the soft failure probability. ",

author = "Yanlin Nie and Qiupei Huang and Xiang Li and Xiaofei Xie and Pommerenke, \{David Johannes\} and Zhiwei Liu and Jizhi Liu",

year = "2021",

month = jun,

day = "23",

doi = "10.23919/IEDS48938.2021.9468832",

language = "English",

booktitle = "International EOS/ESD Symposium on Design and System 2020, IEDS 2020",

publisher = "IEEE",

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note = "1st Annual International EOS/ESD Symposium on Design and System : IEDS 2020, IEDS 2020 ; Conference date: 23-06-2020 Through 25-06-2020",

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AU - Nie, Yanlin

AU - Huang, Qiupei

AU - Li, Xiang

AU - Xie, Xiaofei

AU - Pommerenke, David Johannes

AU - Liu, Zhiwei

AU - Liu, Jizhi

PY - 2021/6/23

Y1 - 2021/6/23

N2 - In this paper, the frequency of injection pulses has been varied to study its influence on soft failure probability. Injection pulses with different frequencies are injected into a camera sub-system of a smartphone prototype. It is found that the pulse frequency is nonlinear with the soft failure probability.

AB - In this paper, the frequency of injection pulses has been varied to study its influence on soft failure probability. Injection pulses with different frequencies are injected into a camera sub-system of a smartphone prototype. It is found that the pulse frequency is nonlinear with the soft failure probability.

UR - https://www.scopus.com/pages/publications/85112868329

U2 - 10.23919/IEDS48938.2021.9468832

DO - 10.23919/IEDS48938.2021.9468832

M3 - Conference paper

AN - SCOPUS:85112868329

BT - International EOS/ESD Symposium on Design and System 2020, IEDS 2020

PB - IEEE

T2 - 1st Annual International EOS/ESD Symposium on Design and System

Y2 - 23 June 2020 through 25 June 2020

ER -

Pulse Frequency Effects on Probability of ESD Soft Failures for a Specific Camera Subsystem

Abstract

Konferenz

ASJC Scopus subject areas

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