Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise

Semih Ramazanoglu; Alicja Michalowska-Forsyth; Bernd Deutschmann

doi:10.1109/Austrochip61217.2023.10285162

Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise

Semih Ramazanoglu^*
, Alicja Michalowska-Forsyth
, Bernd Deutschmann

^*Korrespondierende/r Autor/-in für diese Arbeit

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

The Random Telegraph Noise (RTN) is one of the major reliability concerns in nanoscale CMOS technologies. In this paper, we discuss the characterization of RTN in 40 nm CMOS technology using Ring Oscillators (ROSCs). We used two different types of ROSCs to study the temporal and spectral characteristics of the RTN. With this work, we analyse the suitability of the two types of ROSC for on chip statistical analysis of the RTN amplitude strength and its frequency characteristics. Already the preliminary results, without complete statistical coverage show f/f_max variations of up to 7.18% which maximize RTN observability. Further, the observed broad variations in normalized phase noise under varying power supply levels in the range of 0.5 V to 1 V indicate that also the bias dependence of RTN centers can be investigated using the ROSC technique.

Originalsprache	englisch
Titel	2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings
Herausgeber (Verlag)	IEEE
Seiten	27-30
Seitenumfang	4
ISBN (elektronisch)	9798350357851
DOIs	https://doi.org/10.1109/Austrochip61217.2023.10285162
Publikationsstatus	Veröffentlicht - 2023
Veranstaltung	2023 Austrochip Workshop on Microelectronics: Austrochip 2023 - Graz, Österreich Dauer: 20 Sept. 2023 → 21 Sept. 2023

Workshop

Workshop	2023 Austrochip Workshop on Microelectronics
Kurztitel	Austrochip 2023
Land/Gebiet	Österreich
Ort	Graz
Zeitraum	20/09/23 → 21/09/23

ASJC Scopus subject areas

Elektrotechnik und Elektronik
Sicherheit, Risiko, Zuverlässigkeit und Qualität
Hardware und Architektur
Instrumentierung

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10.1109/Austrochip61217.2023.10285162

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Ramazanoglu, S , Michalowska-Forsyth, A & Deutschmann, B 2023, Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise. in 2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings. IEEE, S. 27-30, 2023 Austrochip Workshop on Microelectronics, Graz, Österreich, 20/09/23. https://doi.org/10.1109/Austrochip61217.2023.10285162

@inproceedings{32ef68ecc9eb4872b4cbdbc8b911cad4,

title = "Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise",

abstract = "The Random Telegraph Noise (RTN) is one of the major reliability concerns in nanoscale CMOS technologies. In this paper, we discuss the characterization of RTN in 40 nm CMOS technology using Ring Oscillators (ROSCs). We used two different types of ROSCs to study the temporal and spectral characteristics of the RTN. With this work, we analyse the suitability of the two types of ROSC for on chip statistical analysis of the RTN amplitude strength and its frequency characteristics. Already the preliminary results, without complete statistical coverage show f/fmax variations of up to 7.18\% which maximize RTN observability. Further, the observed broad variations in normalized phase noise under varying power supply levels in the range of 0.5 V to 1 V indicate that also the bias dependence of RTN centers can be investigated using the ROSC technique.",

keywords = "Jitter, Oxide-trap, Random Telegraph Noise, Ring Oscillator, RTN",

author = "Semih Ramazanoglu and Alicja Michalowska-Forsyth and Bernd Deutschmann",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 Austrochip Workshop on Microelectronics : Austrochip 2023, Austrochip 2023 ; Conference date: 20-09-2023 Through 21-09-2023",

year = "2023",

doi = "10.1109/Austrochip61217.2023.10285162",

language = "English",

pages = "27--30",

booktitle = "2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings",

publisher = "IEEE",

address = "United States",

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TY - GEN

T1 - Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise

AU - Ramazanoglu, Semih

AU - Michalowska-Forsyth, Alicja

AU - Deutschmann, Bernd

PY - 2023

Y1 - 2023

N2 - The Random Telegraph Noise (RTN) is one of the major reliability concerns in nanoscale CMOS technologies. In this paper, we discuss the characterization of RTN in 40 nm CMOS technology using Ring Oscillators (ROSCs). We used two different types of ROSCs to study the temporal and spectral characteristics of the RTN. With this work, we analyse the suitability of the two types of ROSC for on chip statistical analysis of the RTN amplitude strength and its frequency characteristics. Already the preliminary results, without complete statistical coverage show f/fmax variations of up to 7.18% which maximize RTN observability. Further, the observed broad variations in normalized phase noise under varying power supply levels in the range of 0.5 V to 1 V indicate that also the bias dependence of RTN centers can be investigated using the ROSC technique.

AB - The Random Telegraph Noise (RTN) is one of the major reliability concerns in nanoscale CMOS technologies. In this paper, we discuss the characterization of RTN in 40 nm CMOS technology using Ring Oscillators (ROSCs). We used two different types of ROSCs to study the temporal and spectral characteristics of the RTN. With this work, we analyse the suitability of the two types of ROSC for on chip statistical analysis of the RTN amplitude strength and its frequency characteristics. Already the preliminary results, without complete statistical coverage show f/fmax variations of up to 7.18% which maximize RTN observability. Further, the observed broad variations in normalized phase noise under varying power supply levels in the range of 0.5 V to 1 V indicate that also the bias dependence of RTN centers can be investigated using the ROSC technique.

KW - Jitter

KW - Oxide-trap

KW - Random Telegraph Noise

KW - Ring Oscillator

KW - RTN

UR - https://www.scopus.com/pages/publications/85176137459

U2 - 10.1109/Austrochip61217.2023.10285162

DO - 10.1109/Austrochip61217.2023.10285162

M3 - Conference paper

AN - SCOPUS:85176137459

SP - 27

EP - 30

BT - 2023 Austrochip Workshop on Microelectronics, Austrochip 2023 - Proceedings

PB - IEEE

T2 - 2023 Austrochip Workshop on Microelectronics

Y2 - 20 September 2023 through 21 September 2023

ER -

Nanoscale CMOS Ring Oscillators for Statistical Characterization of Random Telegraph Noise

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