In-situ X-ray characterisation of voltage induced changes in organic semiconductors

Alfred Neuhold, Jiri Novak, Heinz-Georg Flesch, Souren Grigorian, Linda Grodd, Ulrich Pietsch, Roland Resel

Publikation: Konferenzbeitrag › Poster

Originalsprache	deutsch
Publikationsstatus	Veröffentlicht - 2010
Veranstaltung	ISOTEC Meeting 2010 - Reinischkogel Dauer: 25 Nov. 2010 → 26 Nov. 2010

Treatment code (Nähere Zuordnung)

@conference{cd6b978e408c4a3db0e76b8ad3732cba,

title = "In-situ X-ray characterisation of voltage induced changes in organic semiconductors",

author = "Alfred Neuhold and Jiri Novak and Heinz-Georg Flesch and Souren Grigorian and Linda Grodd and Ulrich Pietsch and Roland Resel",

year = "2010",

language = "deutsch",

note = "ISOTEC Meeting 2010 ; Conference date: 25-11-2010 Through 26-11-2010",

}