Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data

Steffen Holland; Simon Rauchel; Guido Notermans; Yang Xu; Li Shen; Daryl Beetner; David Pommerenke

Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data

Steffen Holland^*
, Simon Rauchel
, Guido Notermans
, Yang Xu
, Li Shen
, Daryl Beetner
, David Pommerenke

^*Korrespondierende/r Autor/-in für diese Arbeit

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

A method for calculating the peak voltage at the input of the IC is presented for an I/O port subsystem consisting of a TVS protection device, an IC on-chip protection and a PCB trace. The method is valid for non-snapback on-chip protection where the silicon part can be fully described by a quasistatic (VF)-TLP curve and allows to determine the peak voltage from measurement data of the individual components only.

Originalsprache	englisch
Titel	Electrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings
Herausgeber (Verlag)	ESD Association
ISBN (elektronisch)	9781585373406
Publikationsstatus	Veröffentlicht - 2022
Veranstaltung	44th Annual Electrical Overstress/Electrostatic Discharge Symposium: EOS/ESD 2022 - Reno, USA / Vereinigte Staaten Dauer: 18 Sept. 2022 → 23 Sept. 2022

Konferenz

Konferenz	44th Annual Electrical Overstress/Electrostatic Discharge Symposium
Land/Gebiet	USA / Vereinigte Staaten
Ort	Reno
Zeitraum	18/09/22 → 23/09/22

ASJC Scopus subject areas

Elektrotechnik und Elektronik

Andere Dateien und Links

Verknüpfung zur Publikation in Scopus

Dieses zitieren

Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data. / Holland, Steffen; Rauchel, Simon; Notermans, Guido et al.
Electrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings. ESD Association, 2022.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Holland, S, Rauchel, S, Notermans, G, Xu, Y, Shen, L, Beetner, D & Pommerenke, D 2022, Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data. in Electrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings. ESD Association, 44th Annual Electrical Overstress/Electrostatic Discharge Symposium, Reno, USA / Vereinigte Staaten, 18/09/22.

@inproceedings{67b6be48ce9a46fa882585107e293f86,

title = "Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data",

abstract = "A method for calculating the peak voltage at the input of the IC is presented for an I/O port subsystem consisting of a TVS protection device, an IC on-chip protection and a PCB trace. The method is valid for non-snapback on-chip protection where the silicon part can be fully described by a quasistatic (VF)-TLP curve and allows to determine the peak voltage from measurement data of the individual components only.",

author = "Steffen Holland and Simon Rauchel and Guido Notermans and Yang Xu and Li Shen and Daryl Beetner and David Pommerenke",

note = "Publisher Copyright: {\textcopyright} 2022 ESD Association. All rights reserved.; 44th Annual Electrical Overstress/Electrostatic Discharge Symposium : EOS/ESD 2022 ; Conference date: 18-09-2022 Through 23-09-2022",

year = "2022",

language = "English",

booktitle = "Electrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings",

publisher = "ESD Association",

address = "United States",

}

TY - GEN

T1 - Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data

AU - Holland, Steffen

AU - Rauchel, Simon

AU - Notermans, Guido

AU - Xu, Yang

AU - Shen, Li

AU - Beetner, Daryl

AU - Pommerenke, David

PY - 2022

Y1 - 2022

N2 - A method for calculating the peak voltage at the input of the IC is presented for an I/O port subsystem consisting of a TVS protection device, an IC on-chip protection and a PCB trace. The method is valid for non-snapback on-chip protection where the silicon part can be fully described by a quasistatic (VF)-TLP curve and allows to determine the peak voltage from measurement data of the individual components only.

AB - A method for calculating the peak voltage at the input of the IC is presented for an I/O port subsystem consisting of a TVS protection device, an IC on-chip protection and a PCB trace. The method is valid for non-snapback on-chip protection where the silicon part can be fully described by a quasistatic (VF)-TLP curve and allows to determine the peak voltage from measurement data of the individual components only.

UR - https://www.scopus.com/pages/publications/85141872816

M3 - Conference paper

AN - SCOPUS:85141872816

BT - Electrical Overstress/Electrostatic Discharge 2022, EOS/ESD 2022 - Symposium Proceedings

PB - ESD Association

T2 - 44th Annual Electrical Overstress/Electrostatic Discharge Symposium

Y2 - 18 September 2022 through 23 September 2022

ER -

Determining the Peak Voltage during TVS switching at the I/O of an IC using Component Measurement Data

Abstract

Konferenz

ASJC Scopus subject areas

Andere Dateien und Links

Fingerprint

Dieses zitieren