Correlation between systemlevel robustness and TLP results of ESD devices

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Originalsprache	englisch
Titel	International Electrostatic Discharge Workshop
Herausgeber (Verlag)	.
Seiten	---
Publikationsstatus	Veröffentlicht - 2011
Veranstaltung	International Electrostatic Discharge Workshop - Lake Tahoe, CA, USA / Vereinigte Staaten Dauer: 16 Mai 2011 → 19 Mai 2011

Konferenz	International Electrostatic Discharge Workshop
Land/Gebiet	USA / Vereinigte Staaten
Ort	Lake Tahoe, CA
Zeitraum	16/05/11 → 19/05/11

Fields of Expertise

@inproceedings{9d77f6c0675349c8afaaa196de380387,

title = "Correlation between systemlevel robustness and TLP results of ESD devices",

author = "Bernd Deutschmann and Filippo Magrini and Y. Cao and M. Mayerhofer",

year = "2011",

language = "English",

pages = "------",

booktitle = "International Electrostatic Discharge Workshop",

publisher = ".",

note = "International Electrostatic Discharge Workshop ; Conference date: 16-05-2011 Through 19-05-2011",

}

TY - GEN

T1 - Correlation between systemlevel robustness and TLP results of ESD devices

AU - Deutschmann, Bernd

AU - Magrini, Filippo

AU - Cao, Y.

AU - Mayerhofer, M.

PY - 2011

Y1 - 2011

M3 - Conference paper

SP - ---

BT - International Electrostatic Discharge Workshop

PB - .

T2 - International Electrostatic Discharge Workshop

Y2 - 16 May 2011 through 19 May 2011

ER -