Characterizing the Electromagnetic Immunity of Operational Amplifiers based on EMIRR and DPI

Bernd Deutschmann; Gunter Winkler

doi:10.1109/EMCEurope57790.2023.10274196

Characterizing the Electromagnetic Immunity of Operational Amplifiers based on EMIRR and DPI

Bernd Deutschmann^*
, Gunter Winkler

^*Korrespondierende/r Autor/-in für diese Arbeit

Institut für Elektronik (4390)

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

In order to develop robust and reliable electronic sensor systems that function properly even in environments with high electromagnetic pollution, it is important to use so-called EMI hardened operational amplifiers. This paper examines the conducted electromagnetic immunity of such operational amplifiers. Using examples of electromagnetic interference rejection ration (EMIRR) measurements in comparison to direct power injection (DPI) measurements, it is shown that the defined EMIRR measurement using continuous wave (CW) interference signals does not always allow a prediction of immunity against discontinuous interferences like pulse modulated signals which is a more realistic case.

Originalsprache	englisch
Titel	2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023
Herausgeber (Verlag)	IEEE
Seitenumfang	4
ISBN (elektronisch)	9798350324006
DOIs	https://doi.org/10.1109/EMCEurope57790.2023.10274196
Publikationsstatus	Veröffentlicht - 2023
Veranstaltung	2023 International Symposium and Exhibition on Electromagnetic Compatibility: EMC Europe 2023 - Kraków, Polen Dauer: 4 Sept. 2023 → 8 Sept. 2023

Konferenz

Konferenz	2023 International Symposium and Exhibition on Electromagnetic Compatibility
Kurztitel	EMC Europe 2023
Land/Gebiet	Polen
Ort	Kraków
Zeitraum	4/09/23 → 8/09/23

ASJC Scopus subject areas

Physik der kondensierten Materie
Elektrotechnik und Elektronik

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10.1109/EMCEurope57790.2023.10274196

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Deutschmann, B & Winkler, G 2023, Characterizing the Electromagnetic Immunity of Operational Amplifiers based on EMIRR and DPI. in 2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023. IEEE, 2023 International Symposium and Exhibition on Electromagnetic Compatibility, Kraków, Polen, 4/09/23. https://doi.org/10.1109/EMCEurope57790.2023.10274196

@inproceedings{4c711b7ea433427fbc2fce17d3b847c5,

title = "Characterizing the Electromagnetic Immunity of Operational Amplifiers based on EMIRR and DPI",

abstract = "In order to develop robust and reliable electronic sensor systems that function properly even in environments with high electromagnetic pollution, it is important to use so-called EMI hardened operational amplifiers. This paper examines the conducted electromagnetic immunity of such operational amplifiers. Using examples of electromagnetic interference rejection ration (EMIRR) measurements in comparison to direct power injection (DPI) measurements, it is shown that the defined EMIRR measurement using continuous wave (CW) interference signals does not always allow a prediction of immunity against discontinuous interferences like pulse modulated signals which is a more realistic case.",

keywords = "direct power injection, Electromagnetic interference, EMI rejection ratio, operational amplifier",

author = "Bernd Deutschmann and Gunter Winkler",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 2023 International Symposium and Exhibition on Electromagnetic Compatibility : EMC Europe 2023, EMC Europe 2023 ; Conference date: 04-09-2023 Through 08-09-2023",

year = "2023",

doi = "10.1109/EMCEurope57790.2023.10274196",

language = "English",

booktitle = "2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Characterizing the Electromagnetic Immunity of Operational Amplifiers based on EMIRR and DPI

AU - Deutschmann, Bernd

AU - Winkler, Gunter

PY - 2023

Y1 - 2023

N2 - In order to develop robust and reliable electronic sensor systems that function properly even in environments with high electromagnetic pollution, it is important to use so-called EMI hardened operational amplifiers. This paper examines the conducted electromagnetic immunity of such operational amplifiers. Using examples of electromagnetic interference rejection ration (EMIRR) measurements in comparison to direct power injection (DPI) measurements, it is shown that the defined EMIRR measurement using continuous wave (CW) interference signals does not always allow a prediction of immunity against discontinuous interferences like pulse modulated signals which is a more realistic case.

AB - In order to develop robust and reliable electronic sensor systems that function properly even in environments with high electromagnetic pollution, it is important to use so-called EMI hardened operational amplifiers. This paper examines the conducted electromagnetic immunity of such operational amplifiers. Using examples of electromagnetic interference rejection ration (EMIRR) measurements in comparison to direct power injection (DPI) measurements, it is shown that the defined EMIRR measurement using continuous wave (CW) interference signals does not always allow a prediction of immunity against discontinuous interferences like pulse modulated signals which is a more realistic case.

KW - direct power injection

KW - Electromagnetic interference

KW - EMI rejection ratio

KW - operational amplifier

UR - https://www.scopus.com/pages/publications/85174574455

U2 - 10.1109/EMCEurope57790.2023.10274196

DO - 10.1109/EMCEurope57790.2023.10274196

M3 - Conference paper

AN - SCOPUS:85174574455

BT - 2023 International Symposium on Electromagnetic Compatibility - EMC Europe, EMC Europe 2023

PB - IEEE

T2 - 2023 International Symposium and Exhibition on Electromagnetic Compatibility

Y2 - 4 September 2023 through 8 September 2023

ER -

Characterizing the Electromagnetic Immunity of Operational Amplifiers based on EMIRR and DPI

Abstract

Konferenz

ASJC Scopus subject areas

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