Applying CT-FLA for AEB Function Testing: A Virtual Driving Case Study

Ludwig Kampel; Michael Wagner; Dimitris E. Simos; Mihai Nica; Dino Dodig; David Kaufmann; Franz Wotawa

doi:10.1109/ICSTW58534.2023.00049

Applying CT-FLA for AEB Function Testing: A Virtual Driving Case Study

Ludwig Kampel, Michael Wagner, Dimitris E. Simos, Mihai Nica, Dino Dodig, David Kaufmann, Franz Wotawa

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Abstract

The advancements of automated and autonomous vehicles requires virtual verification and validation of automated driving functions, in order to provide necessary safety levels and to increase acceptance of such systems. The aim of our work is to investigate the feasibility of combinatorial testing fault localization (CT-FLA) in the domain of virtual driving function testing. We apply CT-FLA to screen parameter settings that lead to critical driving scenarios in a virtual verification and validation framework used for automated driving function testing. Our first results indicate that CT-FLA methods can help to identify parameter-value combinations leading to crash scenarios.

Originalsprache	englisch
Titel	Proceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023
Herausgeber (Verlag)	IEEE
Seiten	237-245
Seitenumfang	9
ISBN (elektronisch)	9798350333350
DOIs	https://doi.org/10.1109/ICSTW58534.2023.00049
Publikationsstatus	Veröffentlicht - 2023
Veranstaltung	16th IEEE International Conference on Software Testing, Verification and Validation Workshops: ICSTW 2023 - Dublin, Irland Dauer: 16 Apr. 2023 → 20 Apr. 2023

Konferenz

Konferenz	16th IEEE International Conference on Software Testing, Verification and Validation Workshops
Kurztitel	ICSTW 2023
Land/Gebiet	Irland
Ort	Dublin
Zeitraum	16/04/23 → 20/04/23

ASJC Scopus subject areas

Software
Sicherheit, Risiko, Zuverlässigkeit und Qualität
Modellierung und Simulation

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Applying CT-FLA for AEB Function Testing: A Virtual Driving Case Study. / Kampel, Ludwig; Wagner, Michael; Simos, Dimitris E. et al.
Proceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023. IEEE, 2023. S. 237-245.

Publikation: Beitrag in Buch/Bericht/Konferenzband › Beitrag in einem Konferenzband › Begutachtung

Kampel, L, Wagner, M, Simos, DE, Nica, M, Dodig, D, Kaufmann, D & Wotawa, F 2023, Applying CT-FLA for AEB Function Testing: A Virtual Driving Case Study. in Proceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023. IEEE, S. 237-245, 16th IEEE International Conference on Software Testing, Verification and Validation Workshops, Dublin, Irland, 16/04/23. https://doi.org/10.1109/ICSTW58534.2023.00049

@inproceedings{6560b824f5c04fb18eeb900e622652bc,

title = "Applying CT-FLA for AEB Function Testing: A Virtual Driving Case Study",

abstract = "The advancements of automated and autonomous vehicles requires virtual verification and validation of automated driving functions, in order to provide necessary safety levels and to increase acceptance of such systems. The aim of our work is to investigate the feasibility of combinatorial testing fault localization (CT-FLA) in the domain of virtual driving function testing. We apply CT-FLA to screen parameter settings that lead to critical driving scenarios in a virtual verification and validation framework used for automated driving function testing. Our first results indicate that CT-FLA methods can help to identify parameter-value combinations leading to crash scenarios.",

keywords = "AEB, autonomous driving, Combinatorial fault localization, Combinatorial testing, test scenario generation",

author = "Ludwig Kampel and Michael Wagner and Simos, \{Dimitris E.\} and Mihai Nica and Dino Dodig and David Kaufmann and Franz Wotawa",

note = "Publisher Copyright: {\textcopyright} 2023 IEEE.; 16th IEEE International Conference on Software Testing, Verification and Validation Workshops : ICSTW 2023, ICSTW 2023 ; Conference date: 16-04-2023 Through 20-04-2023",

year = "2023",

doi = "10.1109/ICSTW58534.2023.00049",

language = "English",

pages = "237--245",

booktitle = "Proceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023",

publisher = "IEEE",

address = "United States",

}

TY - GEN

T1 - Applying CT-FLA for AEB Function Testing

T2 - 16th IEEE International Conference on Software Testing, Verification and Validation Workshops

AU - Kampel, Ludwig

AU - Wagner, Michael

AU - Simos, Dimitris E.

AU - Nica, Mihai

AU - Dodig, Dino

AU - Kaufmann, David

AU - Wotawa, Franz

PY - 2023

Y1 - 2023

N2 - The advancements of automated and autonomous vehicles requires virtual verification and validation of automated driving functions, in order to provide necessary safety levels and to increase acceptance of such systems. The aim of our work is to investigate the feasibility of combinatorial testing fault localization (CT-FLA) in the domain of virtual driving function testing. We apply CT-FLA to screen parameter settings that lead to critical driving scenarios in a virtual verification and validation framework used for automated driving function testing. Our first results indicate that CT-FLA methods can help to identify parameter-value combinations leading to crash scenarios.

AB - The advancements of automated and autonomous vehicles requires virtual verification and validation of automated driving functions, in order to provide necessary safety levels and to increase acceptance of such systems. The aim of our work is to investigate the feasibility of combinatorial testing fault localization (CT-FLA) in the domain of virtual driving function testing. We apply CT-FLA to screen parameter settings that lead to critical driving scenarios in a virtual verification and validation framework used for automated driving function testing. Our first results indicate that CT-FLA methods can help to identify parameter-value combinations leading to crash scenarios.

KW - AEB

KW - autonomous driving

KW - Combinatorial fault localization

KW - Combinatorial testing

KW - test scenario generation

UR - http://www.scopus.com/inward/record.url?scp=85163138953&partnerID=8YFLogxK

U2 - 10.1109/ICSTW58534.2023.00049

DO - 10.1109/ICSTW58534.2023.00049

M3 - Conference paper

AN - SCOPUS:85163138953

SP - 237

EP - 245

BT - Proceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2023

PB - IEEE

Y2 - 16 April 2023 through 20 April 2023

ER -

Applying CT-FLA for AEB Function Testing: A Virtual Driving Case Study

Abstract

Konferenz

ASJC Scopus subject areas

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